ASEE PEER - Search Results

Look For

Well-matched quotation marks can be used to demarcate phrases, and the + and - operators can be used to require or exclude words respectively

Document collection is

Year Published

Published after

Published before

Look For

Well-matched quotation marks can be used to demarcate phrases, and the + and - operators can be used to require or exclude words respectively

Document collection is

Year Published

Published after

Published before

Displaying all 3 results

Electrons, Holes, And The Hall Effect

Conference Session: ECE Poster Session
Collection: 2007 Annual Conference & Exposition
Authors: J. Shawn Addington, Virginia Military Institute; Wilbur Dale, Virginia Military Institute; Isaac Putnam, Virginia Military Institute
Tagged Divisions: Electrical and Computer

Relevance Score: 3.126309

Relevance Score: 3.126309

Conference Session: ECE Poster Session
Collection: 2007 Annual Conference & Exposition
Authors: Doug Sterk, Virginia Tech; Tim Thacker, Virginia Tech; Elizabeth Tranter, Virginia Tech; Richard Goff, Virginia Tech; Janis Terpenny, Virginia Tech
Tagged Divisions: Electrical and Computer

Relevance Score: 3.126309