Lisa Benson, Clemson University; Sarah Jane Grigg, Clemson University; David R. Bowman, Clemson University; Michelle Cook, Clemson University; Roy P. Pargas, Clemson University / U.S .Air Force Academy
Stephen J. Krause, Arizona State University; Jacquelyn E. Kelly, Arizona State University; Andrea Marta Eller, Arizona State University; Dale R. Baker, Arizona State University; Jessica Triplett, Arizona State University
Javier A. Kypuros, The University of Texas, Pan American; Horacio Vasquez, University of Texas, Pan American; Constantine Tarawneh, The University of Texas, Pan American; Robert D. Wrinkle, University of Texas, Pan American; Martin William Knecht, South Texas College
James E. Lewis, University of Louisville; Patricia A. Ralston, University of Louisville; Norb Delatte, Cleveland State University; David Wheatley, University of Louisville
Garret Nicodemus, University of Colorado, Boulder, Department of Chemical & Biological Engineering; John L. Falconer P.E., University of Colorado, Boulder; Will Medlin, University of Colorado, Boulder
Andy S. Zhang, New York City College of Technology; Iem Heng, New York City College of Technology; Sidi Berri, New York City College of Technology; Farrukh Zia, New York City College of Technology
Margot A. Vigeant, Bucknell University; Michael J. Prince, Bucknell University; Katharyn E. K. Nottis, Bucknell University; Ronald L. Miller, Colorado School of Mines
Stephanie Farrell, Rowan University; Stewart Slater, Rowan University; Mariano Javier Savelski, Rowan University; William J Calvo, Chemical and Molecular Engineering Program, Stony Brook University (Stony Brook, NY)
John J. Duffy, University of Massachusetts, Lowell; Linda Barrington, University of Massachusetts, Lowell; Manuel A Heredia, University of Massachusetts, Lowell
Christopher W. Swan, Tufts University; Kurt Paterson, Michigan Technological University; Olga Pierrakos, James Madison University; Angela R. Bielefeldt, University of Colorado, Boulder; Bradley A. Striebig, James Madison University
Kathleen Meehan, Virginia Tech; Robert W. Hendricks, Virginia Tech; Cortney V. Martin, Virginia Tech; Peter Doolittle, Virginia Tech; Justeen Olinger, Virginia Tech