ASEE PEER - Shi (Stan) Lan

Shi (Stan) Lan

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https://peer.asee.org/authors/101

Co-authors:

Yaqing Mao

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A Comparative Analysis On Learning Characteristics Between Electronics Students In China And In The United States

Conference Session: International Case Studies, Collaborations and Interactions
Collection: 2006 Annual Conference & Exposition
Authors: Shi (Stan) Lan, DeVry University-Chicago; Yaqing Mao, Beijing Normal University, China