Conference Session

Developing New Instrumentation

Collection

2009 Annual Conference & Exposition

Authors

Kamala Mahanta, State University of New York, Oneonta

Tagged Divisions

Instrumentation

with the shrinking size in the relationship betweencharge, voltage and capacitance Q = C V is at the root of this sensitivity since at acapacitance of 10-17F or less, V is likely to be larger than the thermal voltage for a singleelectron moving from one side to the other1. Such effects cause degradation in theperformance of CMOS technology ultimately limiting the device densities attainable withtransistors. These limits have led to the growing importance of developing alternativebottom up approaches such as nano-technology which allows scaling at the limits ofmolecular dimensions. QCA and nano-wires are two such approaches and our interest inthese two areas has been guided by the PI’s prior experience in the field of QuantumInformation