Displaying all 2 results
- Conference Session
- Developing New Instrumentation
- Collection
- 2009 Annual Conference & Exposition
- Authors
- Gary Mullett, Springfield Technical Community College; Yakov Cherner, ATeL, LLC; Edward Bigos, Springfield Technical Community College; Ted Sussmann, Springfield Technical Community College
- Tagged Divisions
- Instrumentation
acquisition problem will be encouraged and documented forpossible adaptation or modification in other contexts. The students in the various ElectronicsGroup technologies will serve as “guinea pigs” for the testing of the materials developed inconjunction with the SensorNet system through structured labs and projects and more complexindividual and group senior capstone projects. Furthermore, as we gain experience with thenetwork it is expected that students from other technology areas will be given access to thenetwork and be allowed to develop networked sensor applications or other network controlscenarios that are relevant to their particular technology. Some of the other application areas thatare expected to be explored include: automation and
- Conference Session
- Instrumentation and Measurement Innovation
- Collection
- 2009 Annual Conference & Exposition
- Authors
- Angel Gonzalez-Lizardo, Polytechnic University of Puerto Rico; Carlos Serrano-Salvat, Polytechnic University of Puerto Rico
- Tagged Divisions
- Instrumentation
technology and innovation, he specialized in electronics, communications and control system. Carlos participated in three summer work experiences with Abbott Laboratories as part of his professional development. Because of his contribution to the company he was allowed to participate for three consecutive summers, when one was the established rule. During his last year of college he was offered the opportunity to work at the Plasma Engineering Laboratory at Polytechnic University of Puerto Rico. His capstone design final project in the electrical engineering program, was to create a computer program to perform the processes for measuring and analyzing plasma parameters. This application