Marcos Esterman, Rochester Institute of Technology; Dorin Patru, Rochester Institute of Technology; Vincent Amuso, Rochester Institute of Technology; Edward Hensel, Rochester Institute of Technology; Mark Smith, Rochester Institute of Technology
Forouzan Golshani, Wright State University; Michele Wheatly, Wright State University; Mary Ellen Bargerhuff, Wright State University; John Flach, Wright State University; Jeffrey Vernooy, Wright State University