Asee peer logo
Well-matched quotation marks can be used to demarcate phrases, and the + and - operators can be used to require or exclude words respectively
Displaying all 3 results
Conference Session
Design And Manufacturing Experiences I
Collection
2004 Annual Conference
Authors
Timothy Hunt; Eduardo Ortega; David Miller; Alfred Striz
Conference Session
Design And Manufacturing Experiences I
Collection
2004 Annual Conference
Authors
Jim Lyall; Rachel Shinn
Conference Session
Design And Manufacturing Experiences I
Collection
2004 Annual Conference
Authors
William Nadir; Peter Young; Il Yong Kim; Olivier de Weck; David Wallace