James Conrad, University of North Carolina at Charlotte; William Heybruck, University of North Carolina at Charlotte; Daniel Hoch, University of North Carolina at Charlotte; Martin Kane, University of North Carolina at Charlotte; Peter Schmidt, University of North Carolina at Charlotte; Frank Skinner, University of North Carolina at Charlotte; Linda Thurman, University of North Carolina at Charlotte
Joseph Hitt, United States Military Academy; Daisie Boettner, United States Military Academy; Stephen Suhr, United States Military Academy; Joel Dillon, United States Military Academy
Robert Todd, Brigham Young University; Christopher Mattson, Brigham Young University; Gregg Warnick, Brigham Young University; Ryan Dymock, Brigham Young University
Paris von Lockette, Rowan University; Eric Constans, Rowan University; Jennifer Courtney, Rowan University; Kevin Dahm, Rowan University; William Riddell, Rowan University; Roberta Harvey, Rowan University
Karen Wosczyna-Birch, CT College of Technology and the Regional Center for Next Generation Manufacturing; Wesley Francillon, Ph.D., Connectiuct Community College; John Birch, The Birch Group, LLC
Yuyi Lin P.E., University of Missouri; Xiuting Wei, Shandong University of Technology; Lanmei Wang, Shandong University of Technology; Yanfei Zhang, Shandong University of Technology; Wenqiang Yu P.E., Shandong University of Technology; Yufeng Sun, Shandong University of Technology