Mihaela Radu, Rose-Hulman Institute of Technology; Clint S. Cole, Digilent, Inc.; Joe Harris, Digilent, Inc.; Mircea Dabacan, Technical University of Cluj-Napoca
Kathleen Meehan, Virginia Tech; Joshua Quesenberry, Virginia Tech; Justeen Olinger, Virginia Western Community College; Kevin Diomedi II, Virginia Western Community College; Robert Hendricks, Virginia Tech; Richard Clark, Virginia Western Community College; Peter Doolittle, Virginia Tech
Manuel Castro, Universidad Nacional de Educacion a Distancia; Gabriel Diaz, Universidad Nacional de Educacion a Distancia; Eugenio Lopez-Aldea, NIEDAX; Nuria Oliva, Universidad Nacional de Educacion a Distancia; Nevena Mileva, Plovdiv Universifty; Catalina Martinez-Mediano, Universidad Nacional de Educacion a Distancia; Mihail Milev, Plovdiv Universifty; Slavka Tzanova, Sofia University; Edmundo Tovar, UPM; Martin Llamas, Universidad de Vigo
Sumit Dutta, University of Illinois at Urbana-Champaign; Shreya Prakash, University of Illinois at Urbana-Champaign; David Estrada, University of Illinois at Urbana-Champaign; Eric Pop, University of Illinois at Urbana-Champaign
Kathleen Meehan, Virginia Tech; Robert W. Hendricks, Virginia Tech; Cortney V. Martin, Virginia Tech; Peter Doolittle, Virginia Tech; Richadr Lee Clark, Virginia Western Community College
John W. Dyer, School of Electrical and Computer Engineering, University of Oklahoma; David Sandmann MSEE, University of Oklahoma; Chad Eric Davis P.E., University of Oklahoma
Jay A. Weitzen, University of Massachusetts Lowell; Alan Rux, University of Massachusetts, Lowell; Erin Isabel Webster, University of Massachusetts Lowell