John Ochs, Lehigh University; Lisa Getzler-Linn, Lehigh University; Margaret Huyck, Illinois Institute of Technology; Scott Schaffer, Purdue University; Mary Raber, Michigan Technology University
Didier Valdes, University of Puerto Rico, Mayaguez; Erika Jaramillo Giraldo, University of Puerto Rico; Jorge Ferrer, University of Puerto Rico, Mayaguez; William Frey, University of Puerto Rico, Mayaguez