Florian Misoc P.E., Southern Polytechnic State University; Tommy D Ball; Austin B. Asgill, Southern Polytechnic State University; Cyril B OKHIO, Southern Polytechnic State University
Richard Chiou, Drexel University; Radian G Belu, Drexel University (Tech.); Michael G Mauk P.E., Drexel University; M. Eric Carr, Drexel University; Tzu-Liang Bill Tseng, University of Texas, El Paso
Assessment & Continuous Improvement in ET: Part III
Collection
2010 Annual Conference & Exposition
Authors
Ali Mehrabian, University of Central Florida; Walter Buchanan, Texas A&M University; Alireza Rahrooh, University of Central Florida; Tarig Ali, University of Central Florida; Saeid Moslehpour, University of Hartford
J. William White AIA, Indiana University Purdue University, Indianapolis; Veto Matthew Ray, Indiana University Purdue University, Indianapolis; Dan D. Koo, Indiana University Purdue University, Indianapolis
Joseph A. Morgan, Texas A&M University; Jay R Porter, Texas A&M University; Dakotah M. Karrer, Texas A&M University; Vincent Michael Rodriguez, Texas A&M University
Yanjun Yan, Western Carolina University; Sudhir Kaul, Western Carolina University; Chip W. Ferguson, Western Carolina University; Paul M. Yanik, Western Carolina University; April Tallant, Western Carolina University
Michael C. Hatfield, University of Alaska, Fairbanks; John Monahan, University of Alaska Fairbanks, Upward Bound; Sarah R Hoffman, University of Alaska Fairbanks; Steven Kibler, Northern Embedded Solutions; Alfred Upton, ACUASI; Patrick Bakke Dewane, University of Alaska, Fairbanks