Vladimir Genis, Drexel University (Tech.); M. Eric Carr, Drexel University; Siddharth Vyas, California Polytechnic State University, San Luis Obispo; Adrian A. Pollock, MISTRAS Group, Inc.
Angela D Hutson-Stone, Indiana University Purdue University, Indianapolis; Julie M. Little-Wiles, Indiana University Purdue University, Indianapolis; Eugenia Fernandez, Indiana University Purdue University, Indianapolis; Patricia Fox, Indiana University Purdue University, Indianapolis
J. William White AIA, Indiana University Purdue University, Indianapolis; Veto Matthew Ray, Indiana University Purdue University, Indianapolis; Dan D. Koo, Indiana University Purdue University, Indianapolis
John L. Irwin, Michigan Technological University; Joshua M. Pearce, Department of Materials Science & Engineering and Department of Electrical & Computer Engineering, Michigan Technological University; Gerald Anzalone, Michigan Technological University; Douglas E. Oppliger P.E., Michigan Technological University
Jason K. Durfee P.E., Eastern Washington University; Donald C. Richter, Eastern Washington University; Martin William Weiser, Eastern Washington University; N.M. A. Hossain, Eastern Washington University; Hani Serhal Saad, Eastern Washington University
Florian Misoc P.E., Southern Polytechnic State University; Tommy D Ball; Austin B. Asgill, Southern Polytechnic State University; Cyril B Okhio P.E., Southern Polytechnic State University
Nikunja Swain P.E., South Carolina State University; Wanda Moses, South Carolina State University; James Allen Anderson P.E., South Carolina State University; Cynthia T Davis, SC State University
Julie M Little-Wiles, Purdue School of Engineering and Technology, IUPUI; Patricia Fox, Indiana University Purdue University, Indianapolis; Charles Feldhaus Ed.D., Indiana University Purdue University, Indianapolis; Stephen Hundley, Indiana University Purdue University, Indianapolis; Brandon Sorge, Indiana University Purdue University, Indianapolis
Richard Chiou, Drexel University; Radian G Belu, Drexel University (Tech.); Michael G Mauk P.E., Drexel University; M. Eric Carr, Drexel University; Tzu-Liang Bill Tseng, University of Texas, El Paso
Antonio Francisco Mondragon, Rochester Institute of Technology (CAST); Adriana Becker-Gomez, Rochester Institute of Technology (KGCOE); Carmen A Bovalino III, Rochester Institute of Technology, Student; Michael B Jones, RIT; Derrick Brazil, Rochester Institute of Technology; Michael R Caldwell, Graduate Student Rochester Institute of Technology; sajin george, RIT