Donald Keating, University of South Carolina; Thomas Stanford, University of South Carolina; Joseph Rencis; Eugene DeLoatch, Morgan State University; Mohammad Noori, North Carolina State University; Edward Sullivan, California Polytechnic State University; David Woodall, Oregon Institute of Technology; Norman Egbert, Rolls-Royce Corporation; David Quick, Rolls-Royce Corporation; Albert McHenry; Roger Olson, Rolls-Royce Corporation; Samuel Truesdale, Rolls-Royce Corporation; Timothy Lindquist, Arizona State University; Harvey Palmer, Rochester Institute of Technology; Joseph Tidwell, Arizona State University Polytechnic; Mark Smith, Rochester Institute of Technology; Duane Dunlap, Purdue University; Mark Schuver, Purdue University; Edmund Segner, University of Alabama at Birmingham; Stephen Tricamo, New Jersey Institute of Technology; Barry Farbrother, University of New Haven; Ken Burbank, Western Carolina University; Carla Purdy, University of Cincinnati; Randall Holmes, Caterpillar Inc.
Jonathan Godfrey, Western Carolina University; James Zhang, Western Carolina University; Aaron Ball, Western Carolina University; Robert Adams, Western Carolina University
Roger Olson, Rolls-Royce Corporation; David Quick, Rolls-Royce Corporation; Samuel Truesdale, Rolls-Royce Corporation; Dennis Depew, Purdue University; Gary Bertoline, Purdue University; Mark Schuver, Purdue University; Duane Dunlap, Western Carolina University; Donald Keating, University of South Carolina; Thomas Stanford, University of South Carolina
Donald Keating, University of South Carolina; Thomas Stanford, University of South Carolina; John Bardo, Western Carolina University; Duane Dunlap, Western Carolina University; Stephen Tricamo, New Jersey Institute of Technology; Eugene DeLoatch, Morgan State University; Dennis Depew, Purdue University; Mark Schuver, Purdue University; Gary Bertoline, Purdue University; Albert McHenry, Arizona State University; Timothy Lindquist, Arizona State University; Joseph Tidwell, Boeing Co.; Mark Smith, Rochester Institute of Technology; Raymond Morrison, Lockheed Martin Aeronautics Co.; Harvey Palmer, Rochester Institute of Technology; Norman Egbert; David Quick, Rolls-Royce Corporation; Roger Olson, Rolls-Royce Corporation; Mohammad Noori, California State Polytechnic University; Samuel Truesdale, Rolls-Royce Corporation; Edward Sullivan, California Polytechnic State University; Joseph Rencis, University of Arkansas; Carla Purdy, University of Cincinnati
Donald Keating, University of South Carolina; Thomas Stanford, University of South Carolina; John Bardo, Western Carolina University; Duane Dunlap, Western Carolina University; Gary Bertoline, Purdue University; Dennis Depew, Purdue University; Mark Schuver, Purdue University; Eugene DeLoatch, Morgan State University; Stephen Tricamo, New Jersey Institute of Technology; Timothy Lindquist, Arizona State University; Albert McHenry, Arizona State University; Harvey Palmer, Rochester Institute of; David Quick, Rolls-Royce Corporation; Mohammad Noori, California State Polytechnic University; Joseph Tidwell, Boeing Co.; Roger Olson, Rolls-Royce Corporation; Samuel Truesdale, Rolls-Royce Corporation
Mark Schuver, Purdue University; Mark Smith, Rochester Institute of Technology; Duane Dunlap, Western Carolina University; Donald Keating, University of South Carolina; Thomas Stanford, University of South Carolina; Joseph Tidwell, Boeing Co.
Dennis Depew, Purdue University; Gary Bertoline, Purdue University; Mark Schuver, Purdue University; Donald Keating, University of South Carolina; Thomas Stanford, University of South Carolina; Duane Dunlap, Western Carolina University
Thomas Stanford, University of South Carolina; Donald Keating, University of South Carolina; Duane Dunlap, Western Carolina University; Roger Olson, Rolls-Royce Corporation
Ronald Kane, New Jersey Institute of Technology; Clarisa Gonzalez-Lenahan, New Jersey Institute of Technology; Michael Kerley, New Jersey Institute of Technology; Jerome Paris, New Jersey Institute of Technology; Janet Bodner, New Jersey Institute of Technology; Ronald Rockland, New Jersey Institute of Technology
Scott Rogers, Georgia Institute of Technology; Jeremy Noonan, Purdue University; Jaemeen Baek, Georgia Institute of Technology; Sangil Lee, Georgia Institute of Technology; Ulas Tezel, Georgia Institute of Technology; Grant Michalski, Georgia Institute of Technology; Chia-Hung Hou, Georgia Institute of Technology
Phillip Sanger, Western Carolina University; Aaron Ball, Western Carolina University; Michael Clare, Western Carolina University; Chip Ferguson, Western Carolina University; John D. Graham, Western Carolina University
LaRuth McAfee, State University of New York-Stony Brook; David Ferguson, State University of New York-Stony Brook; LaRuth McAfee, State University of New York-Stony Brook
Heidar Malki, University of Houston; Michael Gibson, University of Houston; Enrique Barbieri, University of Houston; William Fitzgibbon, University of Houston
Shekhar Bhansali, University of South Florida; Ashanti Pyrtle, University of South Florida; Louis Martin-Vega, University of South Florida; Peter Betzer, University of South Florida