ASEE PEER - Search Results

Look For

Well-matched quotation marks can be used to demarcate phrases, and the + and - operators can be used to require or exclude words respectively

Document collection is

Year Published

Published after

Published before

Look For

Well-matched quotation marks can be used to demarcate phrases, and the + and - operators can be used to require or exclude words respectively

Document collection is

Year Published

Published after

Published before

Displaying all 3 results

Non Contact Surface Roughness Measurement Instrumentation

Conference Session: Novel Measurement Experiments
Collection: 2007 Annual Conference & Exposition
Authors: Claudio Campana, University of Hartford; Brian Derynioski, University of Hartford; Saeid Moslehpour, University of Hartford
Tagged Divisions: Instrumentation

Relevance Score: 0.44973183

Conference Session: Novel Measurement Experiments
Collection: 2007 Annual Conference & Exposition
Authors: Seyed Allameh, Northern Kentucky University; Tom Ogonek Ogonek, Northern Kentucky University; Paul Cooper, Northern Kentucky University
Tagged Divisions: Instrumentation

Relevance Score: 0.44973183

Conference Session: Novel Measurement Experiments
Collection: 2007 Annual Conference & Exposition
Authors: Svetlana Avramov-Zamurovic, U.S. Department of Defense; Kevin Liu, USNA; Bryan Waltrip, NIST; Andrew Koffman, NIST
Tagged Divisions: Instrumentation

Relevance Score: 0.44973183