that are 90 degrees apart).Also, the bridge balance detection signals comparison requires accurate voltage measurements. Two source signals are provided to the system: a sine wave, A, and the sine wave, B, phaseshifted by ninety degrees compared to A. These are the supply signals, in phase and quadrature. The signal analyzer is used to measure the difference in phase between the input and outputsignal across the test component.II. HARDWARE CONFIGURATION Page 12.124.2 The Measurement Computing PCI-DAS6052 card is an analog-to-digital (A/D) and digital-toanalog (D/A) converter card for use in microcomputers. It was selected for the ability
inputs or commands fromusers are relayed to the agent through the RF transceiver. Figure 2: Block diagram of the agent and the host.After two years development, the mechanical structure of the IMAPS agent has evolvedwith three major generations of improved understanding and increased designsophistication. As seen in Figure 3, the first one (A) is a torpedo style pure observer, thesecond generation (B) is a catamaran style Prober that can sample water 100ft deep, thecurrent development is a tank style amphibious Explorer that can work on complexterrain such as marsh or creeks. (A) (B) (C) Figure 3: Three generations of IMAPS body
Roughness Front Figure 3- Inspection Probe (b)The inspection probe consists of a visible laser light source surrounded by four photo detectors.The idea of the apparatus is that laser light is transmitted along a hollow tube and reflects 90° offof a mirror and onto the surface of interest. If the surface is a mirror finish with no roughness,the light would be reflected back along the same path directly towards the laser source. If thesurface contains a rough finish the laser light will still reflect most of its light back towards thesource, but a portion of it will become scattered. Some of the scattered light will find its wayback down the tube, but not collinear with
configuration changes that the homeoccupant can accomplish without professional assistance, allow for built-in security features, andpotential cost savings.The above paper is the result of a research thesis presented to the graduate faculty of MiddleTennessee State University in partial fulfillment of the Master of Science degree in EngineeringTechnology. The research has enhanced the real-world applications and hands-on experiences ofthe author.Bibliography1. Williams, B. (2005). A History of Light and Lighting. Retrieved September 15, 2006 from http://www.mts.net/~william5/history/hol.htm2. Driscoll, E. B. (2002). A Timeline for Home Automation. Retrieved September 20, 2006 from http://www.eddriscoll.com
/(lb*s^2) in^3/s/ma Kce B Kce in^3/s/psi) Friction Valve Flow Pressure Coefficient lbs/(in/s) A
in from the A/D converter. The input ischecked to see which, of four possible quadrants the data falls in, as shown in Fig. 3. Figure 2. (a) Dinsmore R1655 and (b) 8051 microMODUL Page 12.947.4 Figure 3. Quadrants Applied to Actual DataOnce this is determined a series of math functions are carried out on the appropriatecurve to determine the actual reading in degrees. The functions are as follows:Section A (0-90 degrees):RawCompass = (UpLimit – A_Curve) * ScaleCompass = ((Raw Compass/10) * 4) /10Section B (270-360 degrees):RawCompass = (B_Curve – LowLimit) * ScaleCompass = ((Raw Compass/10) * 4) /10Section C (90
the remotemachinery setup as the dedicated computer communicating with the machinery setup throughwireless transceiver. The control privilege of other LAN computer can be controlled; however,they are all kept same for the time being.System Description Figure 4 shows the motor control setup. Speed Monitoring: (a) Hall Effect Sensor NPN type Open collector, (b) 60 pole pair Magnetic Ring (c) Chase 1000 series signal conditioner, outputs 4-20 mA and 0 to ±10 VDC. Speed Controlling: (d) Allen-Bradley 160 SSC, three-phase variable frequency driver, rated at ½ HP. Temperature Monitoring: (e) Three- terminal type RTD temperature sensor (f) SCU universal transmitter/isolator produced by Dwyer (g
AC 2007-1108: ACCURATE CRYOCHAMBER FOR A SMALL LABORATORYWITH SMALL BUDGETMatthew Braley, University of IdahoPaul Anderson, University of IdahoTracey Windley, University of IdahoKevin Buck, University of IdahoHerbert Hess, University of Idaho Page 12.164.1© American Society for Engineering Education, 2007 ACCURATE CRYOCHAMBER FOR A SMALL LABORATORY WITH SMALL BUDGETAbstract Development of electronic devices for cryogenic temperatures requires specializedenvironmental chambers. The Microelectronics Research and Communications Institute requireda low-cost alternative to the readily available environmental chambers. The solution was asimple aluminum
+ - of Polarity (a) (b) Figure 5: Piezoceramic Poling Process: Before (a) and After (b)To pole the piezoceramic, a strong electric field (> 2000 V/mm) is applied to the heatedpiezoceramic material, inducing the material to expand along the axis of the field and contractperpendicular to the axis (Figure 5(b)). After the material cools and the field is removed, theWeiss domains roughly remain in alignment. As a result, the material now has its own polaritywhich can be degraded by exceeding the mechanical, thermal, and electrical limits of thematerial. Subsequently, there is a growth in the direction parallel to the polarization and acontraction in the direction
-assurance era.”What the Physicists Do With Entangled PhotonsThe word “entangled” implies more than just correlation (however entangled photons willexhibit correlation in their measurement statistics). Systems A (or Alice) and B (or Bob) areentangled if their state vector is not a simple product, i.e., if it cannot be written in the form:(state of A)a times (state of B)b. Now taking (+) to represent the state of “spin up” along z and(-) to represent “spin down” – the only two possible spin states of an electron, an example of anentangled state is: (+)a (-)b + (-)a(+)b. If we ask “what is the spin of A?” the answer is – well itcould be up or down, depending on if we “draw” the first or second term respectively when wemeasure it’s state. However, we
respect to the plates, a uniform shear stress occurs across the plates.The steady state inelastic response that commences at a shear stress of 40 MPa continues until Page 12.1338.2fracture at 8% strain. The main role of inelasticity is its insensitivity to localized deformationsites that causes premature failure.The robustness of nacre arises from four design principles as postulated by He et al.1. These are:a) morphology which is optimized to maximize inelastic strain, b) nanoscale asperities that causemechanical interlocking at the interface; sufficient adherence of ceramic layers by the bond layerand d) lubrication provided by the polymer1. A
systems that provide real-timeoutput of building data. In recent years, National Instruments LabVIEW® software1 andFieldPoint® data acquisition hardware2 have provided the data acquisition and analysisinfrastructure for the student projects, making it possible to display real-time data on the internet.This paper describes (a) the design project assignment given to the ENGR 382 students, (b) theweb-based authoring system developed to support the design projects, (c) past student projects,including one in detail, (d) the educational outcomes from the design projects, and (e) challengesto installing and maintaining the students’ instrumentation systems.2 Design project assignmentThe objective of the design project assignment is for students to
Acquisition using National Instruments PXI and cRIO systems. Page 12.1282.1© American Society for Engineering Education, 2007 SMART SENSOR INSTRUMENTATION DEVELOPMENT EXAMPLE INCLUDING THE NEW PARADIGM OF AN FPGA BASED SYSTEMAbstractThis paper showcases two complementary approaches for the design and implementation ofsmart sensor systems. They are (a) Hardware-in-the loop approach (b) Using a single fieldprogrammable gate array (FPGA) to construct an entire intelligent instrumentation system.The first example presents a mechatronic approach, which is a blend of mechanical, electricaland software elements
Input A VO0 VO1 Input A + Reference VO Vin Vo Input B Input B Input 2 1 - CTRL01 Gain = ± 1, 5, 10, 50 CTRL23 Input A Input A Gain = 1, 5, 10, 50 Zin = 1M Zo = 470 Input-offset voltage < 150 V
Page 12.1051.6approximately 10 to 15 minutes of lecture to guide activity, and an additional lecture wasprovided before each lab segment to allow introduction of lab content.An additional 3 class periods were allowed fora final contest-style lab assignment that did notinclude any new hardware or softwarematerial, but did require synthesis of all topicsin the class. An example final contest is shownin Fig. 4. In this contest, students appliedpreviously learned techniques to program theirrobot to autonomously find a soda can in amaze, and carry it to a ‘recycle bin’. The bin’sposition varied, but was always found under alight in the top section of a maze. The robotwas required to pass over certain “detectionpads” (A,B,C) to turn on the recycle
Determining Process Capability of an Industrial Process in Laboratory Using Computer Aided Hardware and Software ToolsAbstractQuality means suitability for use and it is inversely proportional to variability of product, service,people, processes, and environment. However, it is the dynamic state that is associated with eachof the above and that meets or exceeds expectations of a customer. Quality improvement istherefore the progressive reduction of variability. The gradual reduction of process and productvariability can be done by successive determination and removal of the causes responsible for thevariability.For a process industry, causes of product variability happen generally
-on experience with hardware that prior generations exhibited. Experimentationprovides students with a sense of where things deviate from theory, offering the opportunity toexplore non-ideal conditions; while also giving them the chance to play with hardware and gain theexperience and expertise that helps them become successful designers.1,2 For example, electronicstechnicians who had vast hands-on experience were able to reproduce large portions of complexcircuit diagrams after only a few seconds of viewing; whereas novices could not.3 This was due totheir ability to chunk the individual circuit elements that functioned together as an amplifier.Expert scientists and engineers are able to quickly recognize patterns of information; for example
AC 2007-2557: NON CONTACT SURFACE ROUGHNESS MEASUREMENTINSTRUMENTATIONClaudio Campana, University of Hartford Research Engineer in Mechanical Engineering at Engineering Applications Center University of Hartford, College of Engineering Technology and Architecture. Received bachelor's degree from Boston University and Masters from University of Hartford. Area of research is in Cad/Cam Instrumentation and Mechatronics.Brian Derynioski, University of Hartford Brian Derynioski BSEET, Ward College of Technology, University of Hartford, 1985, currently pursuing Masters of Engineering degree in Electrical Engineering, currently employed full time as a contractor at Sikorsky Aircraft