Ziyu Long, Purdue University; Patrice Marie Buzzanell, Purdue University, West Lafayette; Klod Kokini, Purdue University, West Lafayette; Robyn F Wilson, Purdue University; Jennifer C Batra, Purdue University ; Lindsey B. Anderson, Purdue University
Gretchen L. Hein, Michigan Technological University; Kaitlyn J. Bunker; Nilufer Onder, Michigan Technological University; Raven Rachaun Rebb; Laura E. Brown, Michigan Technological University; Leonard J. Bohmann, Michigan Technological University
Sriram Sundararajan, Iowa State University; Theodore J. Heindel, Iowa State University; Baskar Ganapathysubramanian, Iowa State University; Shankar Subramaniam, Iowa State University
Carol E. Marchetti, Rochester Institute of Technology; Margaret B. Bailey, Rochester Institute of Technology; Stefi Alison Baum, Rochester Institute of Technology; Sharon Patricia Mason, Rochester Institute of Technology; Maureen S. Valentine, Rochester Institute of Technology
Heidi Reeder, Boise State University; Patricia A. Pyke, Boise State University; Lynn Lubamersky, Boise State University; Seung Youn Chyung, Boise State University; Cheryl B. Schrader, Missouri University of Science and Technology
Nehal I. Abu-lail, Washington State University; Fatin Aliah Phang, Universiti Teknologi Malaysia; Ashley Ater Kranov, ABET; Khairiyah Mohd-Yusof, Universiti Teknologi Malaysia; Robert G. Olsen, Washington State University; Rochelle Letrice Williams, ABET; Azizan Zainal Abidin, Universiti Teknologi Petronas
Karen Chang Yan, College of New Jersey; Lisa Grega, College of New Jersey; Suriza VanderSandt, College of New Jersey; Diane C. Bates, College of New Jersey; Elizabeth Borland, College of New Jersey; Karen Elizabeth Clark, College of New Jersey; Amanda Norvell, College of New Jersey
Cate Samuelson, University of Washington; Elizabeth Litzler, University of Washington; Candice L. Staples, University of Maryland; Paige E. Smith, University of Maryland, College Park; Catherine T. Amelink, Virginia Tech
Kelsey Morgan Irvin, Washington University in St. Louis; Elizabeth Hiteshue, University of Pennsylvania; Mary Yvonne Lanzerotti, Air Force Institute of Technology; Sheldon Hochheiser, IEEE History Center; Michael Geselowitz, Rutgers, the State University of New Jersey