Xiaobin Le, Wentworth Institute of Technology ; Anthony William Duva, Wentworth Institute of Technology; Richard L. Roberts, Wentworth Institute of Technology; Ali R. Moazed, Wentworth Institute of Technology
Juan C. Ordonez, Florida State University; Jose Vargas, Universidade Federal do Parana; Chiang Shih, Florida A&M University/Florida State University; Necesio Gomes Costa, Universidade Federal de Itajubá
Yuyi Lin P.E., University of Missouri; Xiuting Wei, Shandong University of Technology; Lanmei Wang, Shandong University of Technology; Yanfei Zhang, Shandong University of Technology; Wenqiang Yu P.E., Shandong University of Technology; Yufeng Sun, Shandong University of Technology
Peter L Schmidt, University of North Carolina, Charlotte; Daniel Hoch, University of North Carolina, Charlotte; Nabila A. Bousaba, University of North Carolina, Charlotte; William F. Heybruck, University of North Carolina, Charlotte; Deborah L Sharer, University of North Carolina, Charlotte; Valentina Cecchi, University of North Carolina at Charlotte; Gary Teng, University of North Carolina at Charlotte; Elizabeth Sharer, Francis Marion University
Matthew Green, LeTourneau University; Paul Leiffer, LeTourneau University; Thomas Hellmuth, LeTourneau University; Roger Gonzalez, LeTourneau University; Stephen Ayers, LeTourneau University
P. Ruby Mawasha, Wright State University; Kumar Yelamarthi, Wright State University; J. Mitch Wolff, Wright State University; Joseph Slater, Wright State University; Zhiqiang Wu, Wright State University
Wayne Walter, Rochester Institute of Technology; Jeffrey Webb, Rochester Institute of Technology; Mark Smith, Rochester Institute of Technology; Elizabeth DeBartolo, Rochester Institute of Technology; Margaret Bailey, Rochester Institute of Technology; George Slack, Rochester Institute of Technology