Linda Vanasupa, Franklin W. Olin College of Engineering; Lizabeth T. Schlemer, California Polytechnic State University, San Luis Obispo; Yevgeniya V. Zastavker, Franklin W. Olin College of Engineering
Sebastian Dziallas, Fulbright University Vietnam; Naoko Ellis P.Eng., University of British Columbia; David Robert Bruce P.E., Fulbright University Vietnam
Ekaterina Koromyslova, South Dakota State University; Carrie Steinlicht, South Dakota State University; Teresa J.K. Hall, South Dakota State University; Albena Yuliyanova Yordanova, South Dakota State Univeristy ; Byron G. Garry, South Dakota State University
Aditya Akundi, University of Texas, El Paso; Tzu-Liang Bill Tseng, University of Texas, El Paso; Zejing Cao, The University of Texas at El Paso; Hoejin Kim, University of Texas, El Paso
Ismail Fidan, Tennessee Technological University; George Chitiyo, Tennessee Technological University; Thomas Singer, Sinclair Community College; Jamshid Moradmand, Sinclair Community College
Andy S. Peng, University of Wisconsin - Stout; Brian Eickhoff, Sentera, LLC; Kenan Baltaci, University of Wisconsin - Stout; Liang Zhan, University of Wisconsin - Stout; Robert M. Nelson, University of Wisconsin - Stout
Lisa M. Del Torto, Northwestern University; Bruce Ankenman, Northwestern University; Stacy Benjamin, Northwestern University; Trevor Harty, Northwestern University; Penny L. Hirsch, Northwestern University
Nikhil Gupta, Florida State University; Matthew J Jensen, Florida Institute of Technology; Chiang Shih, Florida A&M University/Florida State University
Jennifer Ocif Love, Northeastern University; Susan F. Freeman, Northeastern University; Daniel Allan Sullivan, Center for STEM Education, Northeastern University
Wade Fagen-Ulmschneider, University of Illinois, Urbana-Champaign; Cinda Heeren, University of Illinois, Urbana-Champaign; Geoffrey L. Herman, University of Illinois, Urbana-Champaign; Matthew West, University of Illinois, Urbana-Champaign
Ryan L. Falkenstein-Smith, Syracuse University; Ryan James Milcarek, Syracuse University; Michael J. Garrett, Syracuse University; Jeongmin Ahn, Syracuse University