Technology Integration in Manufacturing Curriculum
Collection
2022 ASEE Annual Conference & Exposition
Authors
Joseph Ekong, Western New England University; Vedang Chauhan, Western New England University; Janose Osedeme; Seyed Niknam, Western New England University; Richard nguyen
Technology Integration in Manufacturing Curriculum
Collection
2022 ASEE Annual Conference & Exposition
Authors
Aditya Akundi, The University of Texas Rio Grande Valley; Tzu-liang Tseng, University of Texas at El Paso; Md Fashiar Rahman, University of Texas at El Paso; Richard Chiou, Drexel University
Agoritsa Polyzou, Florida International University; Joaquin Molto, Florida International University; Nicholas Sean Gonzalez, Florida International University; Trina L. Fletcher, Florida International University; Sophia Tavio Perez
Tagged Topics
Diversity
Tagged Divisions
Electrical and Computer Engineering Division (ECE)
Valentina Cecchi, University of North Carolina at Charlotte; Courtney S Smith-Orr, University of North Carolina at Charlotte; Paras Mandal, University of Texas at El Paso; Sukumar Kamalasadan
Tagged Divisions
Electrical and Computer Engineering Division (ECE)
Nicholas Mulka, Georgia Institute of Technology; Kinsey Herrin, Georgia Institute of Technology; Amit Shashikant Jariwala, Georgia Institute of Technology
Jorge R. Lara, Texas A&M University; Sunay Palsole, Texas A&M University; Mark H. Weichold, Texas A&M University; Patrick Linke, Texas A&M University at Qatar
Sheri Sheppard, Stanford University; Helen L. Chen, Stanford University; George Toye, Stanford University; Felix Kempf, King's College London; Nada Elfiki, Stanford University
Esmeralda Campos, Tecnologico de Monterrey, Monterrey, Mexico; Carlos Eduardo Martinez-Torteya, Tecnologico de Monterrey (ITESM); Genaro Zavala, Tecnologico de Monterrey, Monterrey, Mexico and Universidad Andres Bello, Santiago, Chile
Steven R. Biegalski, Georgia Institute of Technology; Pavel V. Tsvetkov, Texas A&M University; Yuguo Tao, Georgia Institute of Technology; Vladimir Sobes, University of Tennessee at Knoxville; Karl Pazdernik, Pacific Northwest National Laboratory; Simon Labov, Lawrence Livermore National Laboratory; David F. Williams, Oak Ridge National Laboratory; James M. Ghawaly Jr., Oak Ridge National Laboratory; Alfred Olivier Hero, University of Michigan
Zach Schreiber, Purdue University, West Lafayette; Robert J. Herrick, Purdue University, West Lafayette; Anne M. Lucietto, Purdue University, West Lafayette