Charles Riley, Oregon Institute of Technology; Dave Kim, Washington State University-Vancouver; Ken Lulay, University of Portland; John Lynch, Washington State University
Heidi Curtis, Campbell University; Jacqueline Gartner, Campbell University; Prashanta Dutta, Washington State University; Olusola Adesope, Washington State University; Bernard Van Wie, Washington State University; Carah Watson
Simin Nasseri, Society of Manufacturing Engineers; Mohammad Jonaidi, Kennesaw State University; Navid Nasajpour Esfahani, Georgia Institute of Technology; Ralph Schultz, Kennesaw State University
Saúl Enrique Crespo Sánchez, Tecnologico de Monterrey (ITESM); Miguel X. Rodriguez-Paz, Tecnologico de Monterrey (ITESM); Luis Hernandez Carrasco, Tecnologico de Monterrey (ITESM)
Adam Wickenheiser, University of Delaware; Jenni Buckley, University of Delaware; Amy Trauth, University of Delaware; Marcia Gail Headley, University of Delaware
Michele Grimm, Michigan State University; Ron Averill, Michigan State University; Sara Roccabianca, Michigan State University; Geoffrey Recktenwald, Michigan State University
Annie Wang, University of Michigan; Cassandra Jamison, University of Michigan; Jan Stegemann, University of Michigan; Aileen Huang-Saad, Northeastern University