June 24, 2017
June 24, 2017
June 28, 2017
Engineering Design Graphics
Concept Inventories (CI) are designed to measure student understanding of fundamental concepts and have been used in education reform efforts for the past several years. A CI for engineering graphics is currently being developed. The original intent of the graphics CI was that it would include both “modern” (i.e., CAD) and “traditional” (i.e., sketching, conventions, etc.) fundamental concepts. The first step in the development of the graphics CI was to create open-ended problems for students to solve to determine common misconceptions and to identify future distractors for the eventual multiple choice items. The open-ended problems for traditional topics produced a variety of responses that could be neatly categorized into common misconceptions and from which distractors could be readily identified. However, the open-ended problems for the CAD topics produced multiple responses that were difficult to categorize and interpret. Further, it was apparent that for each open-ended CAD item there were possibly dozens of correct solutions. Since optimal modeling strategies depend on design intent, different CAD packages, or manufacturing processes, judging a correct answer was sometimes impossible. During an Advisory Board meeting for the project, a series of multiple choice questions that had been developed for assessment in a high school competency exam were identified. The project team reviewed the competency exam and identified several promising candidate items for inclusion in the CI. These items were then alpha-tested with a pool of students who had prior CAD knowledge. This paper outlines the results from the alpha-testing of these CAD items and the analysis of their suitability for use in the graphics Concept Inventory.
Nabutola, K., & Steinhauer, H. M., & Branoff, T. J., & Study, N. E., & Miller, C. L., & Nozaki, S. Y. (2017, June), Assessment of CAD Related Items for a Concept Inventory for Engineering Graphics Paper presented at 2017 ASEE Annual Conference & Exposition, Columbus, Ohio. https://peer.asee.org/27633
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