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https://peer.asee.org/authors/36855

Co-authors:

Non-Contact Capacitance-Probe System for Part Inspection

Conference Session
Projects in Manufacturing Curriculum
Collection
2017 ASEE Annual Conference & Exposition
Authors
Michael G. Mauk, Drexel University; Richard Chiou, Drexel University (Eng. & Eng. Tech.); Irina Nicoleta Ciobanescu Husanu, Drexel University (Tech.); David English; Michael Naceri Hazm