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Juan Zambrano
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Paper listing
Permanent URL
https://peer.asee.org/authors/64748
Co-authors:
David Espalin
Patrick Gutierrez
An analysis of Ultrasonic Wire Embedding Data and Waveform Congruency to Identify Process Quality in Additive Manufacturing
Collection
2023 ASEE GSW
Authors
Juan Zambrano
; Patrick Gutierrez; David Espalin
