ASEE PEER - Nicholas Massa

Nicholas Massa

Paper listing

Permanent URL

https://peer.asee.org/authors/22950

Co-authors:

A Synergy Of Internships, Research, Scholarships, And Ate Centers

Collection: 2001 Annual Conference
Authors: Nicholas Massa; Gordon Snyder; Fenna Hanes; James Masi; Gary Mullett

Creating Real-World Problem-Based Learning Challenges in Sustainable Technologies to Increase the STEM Pipeline

Conference Session: Female Faculty, Learning, NSF, and ABET Issues at Two-Year Colleges
Collection: 2011 ASEE Annual Conference & Exposition
Authors: Nicholas Massa, Springfield Technical Community College; Michele Dischino, Central Connecticut State University; Judith F. Donnelly, Three Rivers Community-Technical College; Fenna D. Hanes, New England Board of Higher Education

Learner Interaction And Self Regulation In Web Based Professional Development

Conference Session: Technology and Learning
Collection: 2005 Annual Conference
Authors: Marijke Kehrhahn; Kelli Vallieres; Alexandra Bell; Nicholas Massa

Problem Based Learning In Sustainable Technologies: Increasing The Stem Pipeline

Conference Session: Rethinking Traditional Pedagogical Strategies
Collection: 2010 Annual Conference & Exposition
Authors: Nicholas Massa, Springfield Technical Community College; Michele Dischino, Central Connecticut State University; Judith Donnelly, Three Rivers Community College; Fenna Hanes, New England Board of Higher Education

Problem-based Learning in a Pre-service Technology and Engineering Education Course

Conference Session: Examining Problem-based Learning
Collection: 2012 ASEE Annual Conference & Exposition
Authors: Nicholas Massa, Springfield Technical Community College; Michele Dischino, Central Connecticut State University; Judith Franzosa Donnelly, Three Rivers Community-Technical College; Fenna D. Hanes, New Engalnd Board of Higher Education; James A. DeLaura, Central Connecticut State University

Re Engineering Technician Education For The New Millennium

Conference Session: Systems Approach to Teaching ET
Collection: 2005 Annual Conference
Authors: Gary Masciadrelli; Nicholas Massa; Gary Mullett