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Matthew J. Gualdoni
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Paper listing
Permanent URL
https://peer.asee.org/authors/71281
Co-authors:
Daryl G. Beetner
Ludovic V. Grivault
Testing the Susceptibility of a High-Speed Integrated Circuit
Collection
2012 ASEE Midwest Section Conference
Authors
Ludovic V. Grivault;
Matthew J. Gualdoni
; Daryl G. Beetner
