- Conference Session
- Transfer and Transitions
- Collection
- 2019 ASEE Annual Conference & Exposition
- Authors
- Surendra K. Gupta, Rochester Institute of Technology (COE); Franz Allen Foltz, Rochester Institute of Technology; James E Moon, Rochester Institute of Technology (COE); Roy W Melton, Rochester Institute of Technology (COE); Michael Kuhl, Rochester Institute of Technology (COE); Daniel P. Johnson, Rochester Institute of Technology (CET); James Lee, Rochester Institute of Technology (CET); Rob Garrick, Rochester Institute of Technology (CET); Maureen S. Valentine, Rochester Institute of Technology (CET)
- Conference Session
- Two-Year to Four-Year Transfer Programs: Best Practices
- Collection
- 2016 ASEE Annual Conference & Exposition
- Authors
- Surendra K. Gupta, Rochester Institute of Technology (COE); James E Moon, Rochester Institute of Technology (COE); Mike Eastman, Rochester Institute of Technology (CAST); Daniel P Johnson, Rochester Institute of Technology (CAST); Todd Dunn, Rochester Institute of Technology (CAST)
- Conference Session
- 2-Year College Division: Transferring and Smoothing Transitions
- Collection
- 2020 ASEE Virtual Annual Conference Content Access
- Authors
- Ren Liu; Surendra K. Gupta, Rochester Institute of Technology (COE); Franz Allen Foltz, Rochester Institute of Technology; James E Moon, Rochester Institute of Technology (COE); Roy W Melton, Rochester Institute of Technology (COE); Michael E. Kuhl, Rochester Institute of Technology (COE); Maureen S. Valentine, Rochester Institute of Technology (CET); James H. Lee, Rochester Institute of Technology (CET); Rob Garrick, Rochester Institute of Technology (CET)
- Conference Session
- Engineering/Engineering Technolgy Transfer Issues: Two-year College to Four-year College
- Collection
- 2018 ASEE Annual Conference & Exposition
- Authors
- Surendra K. Gupta, Rochester Institute of Technology (COE); James E. Moon, Rochester Institute of Technology (COE); Roy W. Melton, Rochester Institute of Technology (COE); Michael E. Kuhl, Rochester Institute of Technology ; Daniel P. Johnson, Rochester Institute of Technology (CAST); Todd Dunn, Rochester Institute of Technology (CAST); James H. Lee, Rochester Institute of Technology (CAST); Franz Allen Foltz, RIT; Rob Garrick, Rochester Institute of Technology (CAST)
