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James E Moon

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Paper listing

Conference Session
Transfer and Transitions
Collection
2019 ASEE Annual Conference & Exposition
Authors
Surendra K. Gupta, Rochester Institute of Technology (COE); Franz Allen Foltz, Rochester Institute of Technology; James E Moon, Rochester Institute of Technology (COE); Roy W Melton, Rochester Institute of Technology (COE); Michael Kuhl, Rochester Institute of Technology (COE); Daniel P. Johnson, Rochester Institute of Technology (CET); James Lee, Rochester Institute of Technology (CET); Rob Garrick, Rochester Institute of Technology (CET); Maureen S. Valentine, Rochester Institute of Technology (CET)
Conference Session
Two-Year to Four-Year Transfer Programs: Best Practices
Collection
2016 ASEE Annual Conference & Exposition
Authors
Surendra K. Gupta, Rochester Institute of Technology (COE); James E Moon, Rochester Institute of Technology (COE); Mike Eastman, Rochester Institute of Technology (CAST); Daniel P Johnson, Rochester Institute of Technology (CAST); Todd Dunn, Rochester Institute of Technology (CAST)
Conference Session
2-Year College Division: Transferring and Smoothing Transitions
Collection
2020 ASEE Virtual Annual Conference Content Access
Authors
Ren Liu; Surendra K. Gupta, Rochester Institute of Technology (COE); Franz Allen Foltz, Rochester Institute of Technology; James E Moon, Rochester Institute of Technology (COE); Roy W Melton, Rochester Institute of Technology (COE); Michael E. Kuhl, Rochester Institute of Technology (COE); Maureen S. Valentine, Rochester Institute of Technology (CET); James H. Lee, Rochester Institute of Technology (CET); Rob Garrick, Rochester Institute of Technology (CET)
Conference Session
Engineering/Engineering Technolgy Transfer Issues: Two-year College to Four-year College
Collection
2018 ASEE Annual Conference & Exposition
Authors
Surendra K. Gupta, Rochester Institute of Technology (COE); James E. Moon, Rochester Institute of Technology (COE); Roy W. Melton, Rochester Institute of Technology (COE); Michael E. Kuhl, Rochester Institute of Technology ; Daniel P. Johnson, Rochester Institute of Technology (CAST); Todd Dunn, Rochester Institute of Technology (CAST); James H. Lee, Rochester Institute of Technology (CAST); Franz Allen Foltz, RIT; Rob Garrick, Rochester Institute of Technology (CAST)