Asee peer logo
advanced search

Nathan M. Kathir P.E.

Permalink

Paper listing

Permanent URL

https://peer.asee.org/authors/58587

Co-authors:

Designing and Building of a Micro-Fatigue Testing Device for Scanning Electron Microscope (SEM) In-Situ Testing for Naval Applications

Conference Session
Ocean and Marine Division (OMED) Technical Session 1
Collection
2023 ASEE Annual Conference & Exposition
Authors
Nathan M. Kathir, P.E., George Mason University; Mehdi Amiri