Seattle, Washington
June 14, 2015
June 14, 2015
June 17, 2015
978-0-692-50180-1
2153-5965
Computer-Based Tests, Problems, and Other Instructional Materials
Computers in Education
13
26.387.1 - 26.387.13
10.18260/p.23726
https://peer.asee.org/23726
699
Craig Zilles is an Associate Professor in the Computer Science department at the University of Illinois at Urbana-Champaign. His current research focuses on computer science education and computer architecture. His research has been recognized by two best paper awards from ASPLOS (2010 and 2013) and by selection for inclusion in the IEEE Micro Top Picks from the 2007 Computer Architecture Conferences. He received the IEEE Education Society's Mac Van Valkenburg Early Career Teaching Award in 2010, a (campus-wise) Illinois Student Senate Teaching Excellence award in 2013, the NSF CAREER award, and the Univerisity of Illinois College of Engineering's Rose Award and Everitt Award for Teaching Excellence. Prior to his work on education and computer architecture, he developed the first algorithm that allowed rendering arbitrary three-dimensional polygonal shapes for haptic interfaces (force-feedback human-computer interfaces). He holds 6 patents.
Jacob Bailey is currently a sophomore studying computer science at the University of Illinois.
Dr. Wade Fagen is a Lecturer in the Department of Computer Science in the College of Engineering at The University of Illinois at Urbana-Champaign (UIUC). He teaches one of UIUC's largest courses, Introduction to Computer Science, known as CS 105. His research aims to improve learning by using technologies that students already bring to the classroom.
Dr. Cinda Heeren is an award-winning Senior Lecturer at the University of Illinois, Urbana-Champaign. She teaches CS225, Data Structures and Programming Principles, to hundreds of enthusiastic and talented undergraduates every year. She is always game to try new pedagogical innovations, and she loves telling young women about her affection for computing.
Matthew West is an Associate Professor in the Department of Mechanical Science and Engineering at the University of Illinois at Urbana-Champaign. Prior to joining Illinois he was on the faculties of the Department of Aeronautics and Astronautics at Stanford University and the Department of Mathematics at the University of California, Davis. Prof. West holds a Ph.D. in Control and Dynamical Systems from the California Institute of Technology and a B.Sc. in Pure and Applied Mathematics from the University of Western Australia. His research is in the field of scientific computing and numerical analysis, where he works on computational algorithms for simulating complex stochastic systems such as atmospheric aerosols and feedback control. Prof. West is the recipient of the NSF CAREER award and is a University of Illinois Distinguished Teacher-Scholar and College of Engineering Education Innovation Fellow.
Computerized Testing: A Vision and Initial Experiences In a large (200+ students) class, running exams is a logistical nightmare. Such examsrequire conflict exams and figuring out how to address the full range of Bloom’s taxonomylearning goals in a manner that can be efficiently graded to give quick student feedback.Typically, these exam hassles lead instructors to have a few, large, multiple-choice intenseexams, which can be suboptimal for student learning. In this paper, we pursue a different vision, enabled by making a computer a central part ofthe testing process. We envision a computerized testing center, proctored 60-80 hours/week.When a course assigns a (computerized) exam, the professor specifies a range of days for theexam and the student reserves a time of their convenience. When the student arrives, theyare ushered to a machine that has been booted into the specified exam configuration (manydifferent exams are being run in the testing center concurrently). The student logs in andis ushered through their exam. Each exam consists of a random selection of parameterizedproblems meeting coverage and difficulty criteria, so each exam is different. The networkingon the machine is configured to prevent unauthorized communication. The system displaysand controls the remaining time for the exam. We see two main advantages of this approach. First, we centralize all of the hasslesof running exams, so course staff no longer have to manage the scheduling, staffing, andpaper shuffling of running exams. As such, we drastically lower the effort of running exams,making more frequent, lower stakes testing and second chance testing practical. Second, we greatly broaden the kinds of questions that can be machine graded. Mostlarge classes rely at least partially on scantrons for automation, but many of the questionsthat we want to ask aren’t multiple choice. With a computer involved, you can ask (andauto-grade) any question that can be objectively scored; you can ask students to designcircuits, do graphical problems like drawing acceleration vectors, write code, write equations,draw force diagrams, align genetic sequences, etc. Furthermore, as modern engineering ispracticed in a heavily computer-supported environment, we can have them use industrystandard software to solve design and analysis problems. This is particularly compelling inprogramming classes, where students can compile, test, and debug their problems beforesubmitting them for grading. In this paper, we’ll describe our experiences with a prototype computerized testing laband running all of a 200-student computer organization class’s exams using computerizedtesting. We’ll discuss the mechanics of operating the testing lab, the work required by theinstructor to enable this approach (e.g., generating a diversity of equivalent difficulty prob-lems), and the student response, which has been strongly positive: 75% prefer computerizedtesting, 12% prefer traditional written exams, and 13% had no preference.
Zilles, C., & Deloatch, R. T., & Bailey, J., & Khattar, B. B., & Fagen-Ulmschneider, W., & Heeren, C., & Mussulman, D., & West, M. (2015, June), Computerized Testing: A Vision and Initial Experiences Paper presented at 2015 ASEE Annual Conference & Exposition, Seattle, Washington. 10.18260/p.23726
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