unknown
March 17, 2022
March 7, 2010
March 10, 2010
9
10.18260/1-2-620-39068
https://peer.asee.org/39068
488
Liu, Y., & Srivastava, A. (2022, March), EFFECT OF HOT CARRIER INJECTION AND NEGATIVE BIAS TEMPERATURE INSTABILITY ON THE PERFORMANCE OF CMOS PHASE-LOCKED LOOPS Paper presented at 2010 GSW, unknown. 10.18260/1-2-620-39068
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