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Electronic Circuit Design And Analysis For Space Applications

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Conference

2001 Annual Conference

Location

Albuquerque, New Mexico

Publication Date

June 24, 2001

Start Date

June 24, 2001

End Date

June 27, 2001

ISSN

2153-5965

Page Count

8

Page Numbers

6.411.1 - 6.411.8

Permanent URL

https://peer.asee.org/9172

Download Count

1130

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Paper Authors

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Biswajit Ray

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Abstract

Electronic circuit design and analysis in commercial applications takes into account component parameter variations due to initial tolerance, temperature, and aging. For space applications, the additional component parameter variation due to radiation needs to be taken into account. The charged particles in space radiation environment consist primarily of high-energy electrons, protons, alpha particles and heavy ions (cosmic rays). The radiation effects of these charged particles are dominated by ionization in electronic devices, and the resulting total ionizing dose (TID), single-event effects (SEE), and enhanced low dose rate sensitivity (ELDRS) issues are briefly discussed. Details of circuit design and worst case analysis are presented for two simple circuits: a three-terminal linear regulator, and a relay coil driver. Approaches to the detailed worst case circuit analysis, and an awareness on the need of the analysis to be performed before the design is released to manufacturing should be part of a well-rounded electronics design curriculum.

Ray, B. (2001, June), Electronic Circuit Design And Analysis For Space Applications Paper presented at 2001 Annual Conference, Albuquerque, New Mexico. https://peer.asee.org/9172

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