June 26, 2011
June 26, 2011
June 29, 2011
Electrical and Computer
22.847.1 - 22.847.14
Incorporating LabView® in Junior Electrical Engineering Labs LabView® is a popular instrument control and automation software tool that is widely used in industry. Sufficient LabView® programming skills greatly improve engineers’ productivity, and these skills are in high demand. On the other hand, it is usually a common weakness in Electrical Engineering (EE) as well as in general engineering programs that the students are lacking in the application of appropriate software to solve engineering problems. As a part of the continuous curriculum improvement strategy, we are implementing a LabView® programming thread in the EE curriculum to enhance the students’ real‐world ready and workplace applicable skills. Building upon the successful incorporation of LabView® programming into engineering technology programs within the same department, this paper will discuss the general plan of the implementation of the LabView® programming thread in the EE program and outline in detail the designed LabView® programming activities in junior EE Labs. The LabView® series sessions in junior EE Labs starts with simple activities of instrument communications and file manipulation for data collection, progresses into more systematical activities of instrument control and data trace collection for specific instruments (such as a digital oscilloscope), and gradually integrates into other Lab sessions. Student feedback in the form of standard Student Assessment of Instruction (SAI) as well as Small Group Analysis (SGA) focused on the learning experience enhancement will be used as the formal assessment of the incorporation of LabView® programming activities within the EE curriculum. The results of these assessment activities will be reported. This paper will emphasize the curriculum integration strategies, educational methodology and merit of this approach.
Yang, B., & Adams, R. D., & Ball, A. K. (2011, June), Incorporating LabView(R) in Junior Electrical Engineering Labs Paper presented at 2011 ASEE Annual Conference & Exposition, Vancouver, BC. https://peer.asee.org/18128
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