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Integration Of Enhanced Coordinate Measuring Machine Systems With Manufacturing Engineering Laboratories And Curriculum At Kettering University

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Conference

2001 Annual Conference

Location

Albuquerque, New Mexico

Publication Date

June 24, 2001

Start Date

June 24, 2001

End Date

June 27, 2001

ISSN

2153-5965

Page Count

15

Page Numbers

6.625.1 - 6.625.15

Permanent URL

https://peer.asee.org/9428

Download Count

165

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Paper Authors

author page

Gwan-Ywan Lai

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Abstract

Coordinate Measuring Machines (CMMs) are one of the most powerful and widely used metrological instruments in the manufacturing industry. There is virtually no workpiece whose dimensions cannot be measured with a properly equipped CMM system [1-6]. This National Science Foundation funded project (NSF-ILI: DUE-9851082) is to enhance two existing CMMs in the Metrology laboratory at Kettering University by acquiring two motorized probe heads, an automatic probe exchange system, a stylus changing probe and rack system, a laser digitizing system, and PC-DMIS CMM inspection software. The enhanced CMM systems allow for integration of modern, automated, and CAD-directed coordinate metrology as well as state-of- the-art laser digitizing technology into Manufacturing Engineering laboratories and curriculum at Kettering University. The project impacts students enrolled in the freshman course, MFGE-101 Manufacturing Processes and upper level courses such as Numerically Controlled (NC) Systems, Polymer Processing, and Computer Integrated Manufacturing (CIM) Systems.

Lai, G. (2001, June), Integration Of Enhanced Coordinate Measuring Machine Systems With Manufacturing Engineering Laboratories And Curriculum At Kettering University Paper presented at 2001 Annual Conference, Albuquerque, New Mexico. https://peer.asee.org/9428

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