Columbus, Ohio
June 24, 2017
June 24, 2017
June 28, 2017
Instrumentation
Diversity
11
10.18260/1-2--28589
https://peer.asee.org/28589
3114
Lash Mapa is a Professor in Industrial/Mechanical Engineering Technology at Purdue University Calumet (PUC). His undergraduate and graduate degrees are in Chemical Engineering. He has several years’ experience as a Chemical Engineer, Process and Project manager with European and U.S. manufacturing organizations. Currently, he is involved in the MS Technology program at PUC and has managed over thirty lean six sigma projects with manufacturing, service industry and educational institutions. He is a certified six sigma black belt and a certified quality engineer with ASQ
Radio Frequency Identification (RFID) technology has been adopted and widely used in many applications including agriculture, forest industry, hospitals, highway transportation, and manufacturing industry. Due to its advantages such as tracking and real-time monitoring. RFID technology uses the tag to store limited data that can be read by RFID reader through the antenna. Passive RFID technology is commonly used in industry because of no power source requirement on the tag. Instead, the tag uses the electromagnetic energy transmitted from the reader, which creates significant interference between readers, to transmit stored data. Many literatures focus on the electromagnetic interference (EMI) between antennas to investigate the effect and find the solution. However, noise is another important factor in wireless communication, which may impact on the reading rate in RFID, because RFID uses the small range wireless communication to read the transmitted data from the tag. In this paper, we consider two factors, distance and temperature, to investigate how they affect the RFID read rate. The data collected at various temperature will be compared to the results from normal temperature and the effects of temperature in RFID will be discussed.
Kim, T., & Mapa, L. B., & Ramamurthy, D., & Goni, F. (2017, June), Investigating the Effect of Temperature in RFID Technology Paper presented at 2017 ASEE Annual Conference & Exposition, Columbus, Ohio. 10.18260/1-2--28589
ASEE holds the copyright on this document. It may be read by the public free of charge. Authors may archive their work on personal websites or in institutional repositories with the following citation: © 2017 American Society for Engineering Education. Other scholars may excerpt or quote from these materials with the same citation. When excerpting or quoting from Conference Proceedings, authors should, in addition to noting the ASEE copyright, list all the original authors and their institutions and name the host city of the conference. - Last updated April 1, 2015