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On Line Measurement & Embedded Instrumentation Projects In Engineering Education

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Conference

2001 Annual Conference

Location

Albuquerque, New Mexico

Publication Date

June 24, 2001

Start Date

June 24, 2001

End Date

June 27, 2001

ISSN

2153-5965

Page Count

8

Page Numbers

6.759.1 - 6.759.8

DOI

10.18260/1-2--9626

Permanent URL

https://peer.asee.org/9626

Download Count

396

Paper Authors

author page

Claudio Campana

author page

Jun Kondo

author page

Devdas Shetty

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Abstract
NOTE: The first page of text has been automatically extracted and included below in lieu of an abstract

Session 1359

ON-LINE MEASUREMENT & EMBEDDED INSTRUMENTATION PROJECTS IN ENGINEERING EDUCATION

Devdas Shetty1, Claudio Campana2 and Jun Kondo3 College of Engineering, University of Hartford

1 Vernon D. Roosa Professor in Manufacturing Engineering, shetty@mail.hartford.edu 2 Research Engineer, campana@mail.hartford.edu 3 Research Engineer, kondo@mail.hartford.edu

Abstract:

This paper presents an experimental approach for intelligent monitoring of a Computer Controlled Machining Process using embedded instrumentation. The article reviews the ongoing development in the field of embedded systems. This is followed by presentation of the hardware and software scheme adopted to implement on-line inspection procedures for surface roughness and geometrical data measurement of the machined part. The surface finish data is obtained using a newly designed laser based technique; where as geometrical data is obtained using a specially designed optical digitizer. These measurement techniques will be implemented in the form of embedded systems. The paper concludes by giving examples of how these instruments are adopted for an on-line monitoring process in an aerospace industry.

1 Embedded Microcontrollers

An embedded microcontroller is a small but complete computer system implemented on a single silicon chip. It often includes memory, Input/Output, communications, and Analog / Digital conversion capabilities. The principal difference between this device and a general-purpose microprocessor is that it integrates memory and I/O capabilities onto a single silicon chip, whereas the general-purpose device requires external memory and I/O circuitry. The primary components of a microcontroller are: CPU, Data Memory, Program Memory, Digital I/O, Time/Counters, A/D Converter, Communications and Interrupts. Among its many capabilities is the ability to do Digital Signal Processing (DSP) functions such as thresholding, linearization and filtering of signals.

Low-cost microcontrollers embedded into sensor products add end-user value to those products. Many new applications become cost effective when the cost of incorporating a microprocessor into a sensor compares to that of adding an op amp and several resistors. A microcontroller can be used either to replace existing analog-/discrete-logic functions, or, to add enhanced functionality.

Proceedings of the 2001 American Society for Engineering Education Annual Conference & Exposition Copyright  2001, American Society for Engineering Education

Campana, C., & Kondo, J., & Shetty, D. (2001, June), On Line Measurement & Embedded Instrumentation Projects In Engineering Education Paper presented at 2001 Annual Conference, Albuquerque, New Mexico. 10.18260/1-2--9626

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