June 24, 2007
June 24, 2007
June 27, 2007
Electrical and Computer
12.1132.1 - 12.1132.10
Optoelectronic Device and Fiber Link Characterization in Computer Integrated Electronics Laboratory
This paper describes how automated measurement capabilities of a Computer-Integrated Electronics laboratory can be adapted to establish a laboratory resource to do optoelectronic device and optical fiber link characterization measurements and SPICE modeling work to augment Optoelectronics courses. It is shown that with minimal additional investment in an Optical Spectrum Analyzer and a ThermoStream temperature controller, light sources, such as LASER diodes, LEDs, Incandescent and Discharge Lamps, and detectors such as Photodiodes and Solar Cells, and optoelectronic combinations of them like Optical Isolators and Optical Fiber Links can be characterized for their electrical, opto-electrical and spectral characteristics. Examples of experimental results are given with descriptions of circuits, experimental setups and measurement methodology.
Proliferation of fiber optic system as the most reliable, inexpensive and wide bandwidth communication systems for both long distance and local data and voice communication is demanding Electrical Engineering curricula to adapt and include courses in Optoelectronics and Fiber Optics. This paper describes utilization of existing Computer-Integrated-Electronics Laboratory equipment to facilitate typically lecture-only Optoelectronics courses with a laboratory with minimal additional investment.
Automated measurement capabilities of a Computer-Integrated Electronics Laboratory can be used to give the student an opportunity to do many experiments in a short time by saving on the manual activity of point by point data collection and free the time for educationally more valuable activities like evaluation, analysis and interpretation of the data.
The Computer-Integrated-Electronics laboratory equipment used for the automated measurement system reported here consists of a Hewlett Packard Digitizing Oscilloscope (Model 54501A), a Tektronix Arbitrary Function Generator (AFG 5101) and a Tektronix Programmable Digital Multimeter (DM 5120) all with GPIB interface, and a Tektronix Triple Power Supply (PS 250). A Pentium IV computer equipped with National Instrument's IEEE488.2 card controls the setup. Such a combination is typically used in to test and debug electronic circuits. The author has shown that the same set of instruments can also be employed for the automated measurement of I-V and C-V characteristics of semiconductor devices and sensors and, to extract SPICE parameters from them in the laboratory (Guvench , , ).
With the addition of an inexpensive Ocean Optics Model HR2000CG-UV-NIR optical spectrometer and a Thermostream Model AM-003 sample cooler/heater to the electronics
Guvench, M. (2007, June), Optoelectronic Device And Fiber Link Characterization Paper presented at 2007 Annual Conference & Exposition, Honolulu, Hawaii. https://peer.asee.org/1521
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