Chicago, Illinois
June 18, 2006
June 18, 2006
June 21, 2006
2153-5965
Materials
6
11.1110.1 - 11.1110.6
10.18260/1-2--993
https://peer.asee.org/993
494
Dr. Castellini was a postdoctoral researcher with the Interdisciplinary Education Group of the University of Wisconsin - Madison Materials Research Science and Engineering Center (UW MRSEC) and is now an exhibit developer at the Museum of Science and Industry.
Ms. Walejko was an intern with the UW MRSEC Internships in Public Science Education Program.
Ms. Holladay was an intern with the UW MRSEC Internships in Public Science Education Program.
Ms. Theim was an intern with the UW MRSEC Internships in Public Science Education Program.
Mr. Cina is a teacher at O'Keefe Middle School and has participated in the UW MRSEC Research Experiences for Teachers Program.
Ms. Zenner is Assistant Director of the Interdisciplinary Education Group of the UW MRSEC.
Prof. Crone is an Associate Professor in the Department of Engineering Physics and Director of the Interdisciplinary Education Group of the UW MRSEC.
Seeing the Nanoscale: Using Interactives to Teach Probe Microscopy
Abstract
Probe microscopes are key tools for surface characterization and nanoscale science. This category of instrumentation has enabled researchers both to investigate properties and to manipulate materials at the nanoscale. When introduced to nanoscale science and engineering, students frequently ask “How do we know it is there if we can’t see it with our eyes?” To address this query, students of all ages can be introduced to the basic concepts of probe microscopy and given the opportunity to explore probe techniques. We have developed interactive exhibits and classroom activities that allow middle- and high-school students to detect and map topography, stiffness, and magnetic field. These products will be presented along with assessment data collected with the Rennie and McClafferty protocol for formative evaluation of interactive exhibits.
Introduction
Scanning probe microscopy (SPM) was first developed in the 1980s and uses an extremely fine probe tip to image a surface at the nanometer scale. Since its inception, this class of microscopy technique has proven invaluable for imaging, studying, and manipulating atoms and materials at the nanoscale. A number of different instruments fall into this category, including atomic force microscope (AFM), magnetic force microscope (MFM), and scanning tunneling microscope (STM). Researchers in nanoscale science and engineering (NSE) consider these SPM techniques to be an enabling factor that has allowed this emerging field to expand as rapidly as it has. Consequently, when considering an NSE education and outreach program, it is important to include materials that help students understand this fundamental tool.
The need for students to learn and appreciate the basic concepts behind NSE is increasing rapidly. Nanotechnology is inherently interdisciplinary in nature and is becoming increasingly important in fields such as medicine, electronics, and communications. It is estimated that by 2015, nanotechnology will be a trillion dollar industry employing five million workers1, 2. However, there is concern that today’s students will not be adequately prepared, thus creating a future bottleneck of skilled technicians and researchers and a citizenry ignorant of this new field. Primary and secondary educators need to instill knowledge fundamental to nanotechnology in their students now3 in order to prepare them for the boom in nanotechnology-related jobs that is predicted to occur and for the increased effect nanotechnology promises to have on society.
Interactive Activities as a Vehicle for Teaching Nano
Despite the increasing need, NSE currently does not occupy a place in the standard K-12 curriculum4, and the main ideas important to this field are novel and difficult to grasp, especially for young students that are still learning about scale and powers of ten. Interactive activities, such as those found in museum exhibits and at outreach events, engage students and can help
Castellini, O., & Walejko, G., & Holladay, C., & Theim, T., & Cina, A., & Zenner, G., & Crone, W. (2006, June), Seeing The Nanoscale: Using Interactives To Teach Probe Microscopy Paper presented at 2006 Annual Conference & Exposition, Chicago, Illinois. 10.18260/1-2--993
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