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Teaching The Importance Of Data Correlation In Engineering Technology

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Conference

2002 Annual Conference

Location

Montreal, Canada

Publication Date

June 16, 2002

Start Date

June 16, 2002

End Date

June 19, 2002

ISSN

2153-5965

Conference Session

Innovative Curriculum in ET

Page Count

10

Page Numbers

7.1104.1 - 7.1104.10

Permanent URL

https://peer.asee.org/10763

Download Count

29

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Paper Authors

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Jay Porter

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Dana Burnett

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Michael Warren

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Rainer Fink

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Abstract
NOTE: The first page of text has been automatically extracted and included below in lieu of an abstract

Session 3549

Teaching the Importance of Data Correlation in Engineering Technology

Michael R. Warren, Dana M. Burnett, Jay R. Porter, and Rainer J. Fink Texas A&M University

Abstract

To meet the needs of the semiconductor test industry, entry-level test engineers must understand the importance of correlation between characterization test equipment and industrial automated test platforms (ATEs). The expectation is that the test engineer should be able to use data from multiple platforms to aid in debugging device designs and test programs. As part of the Semiconductor Testing Initiative, the Electronics Engineering Technology Program at Texas A&M University has begun to address this issue in their mixed-signal test course sequence.

Using a DAC0808 digital-to-analog converter as a test chip, students correlate the data between a Teradyne A567 tester and a National Instruments’, Inc. test system with LabVIEW 6i and a PCI- 6025E data acquisition card. Several test-related issues are then explored including debugging, limitations of test equipment, and device interface board design constraints.

I. Introduction

The Electronics Engineering Technology (EET) Program at Texas A&M University in conjunction with Texas Instruments has formed a Semiconductor Test Initiative to help find new and dynamic methods of teaching concepts in mixed signal test. [1] This initiative began with the donation of a Teradyne A567 automated production (ATE) tester by Texas Instruments, Inc. and Teradyne, Inc., which is currently being used in the advanced mixed signal test course. This is one of two mixed signal test courses that are currently offered within the EET program. The introductory and advanced mixed signal courses give students a hands-on experience in the field of mixed signal test. By using both the ATE tester and a PC-based lab station, a variety of topics in mixed signal test taught in the classroom can be reinforced through a laboratory experience. One topic that is of particular interest is that of data correlation between test platforms.

Data correlation refers to the ability to test a device on different hardware or software platforms and still obtain the same results. Correlation between different platforms is a problem that mixed-signal test and design engineers continually face during a product’s life cycle. [2] For example, a design engineer evaluating performance might test a new device in a characterization lab. At the same time, a test engineer preparing for production is also testing the device on an ATE. Quite often, similar tests will

Proceedings of the 2002 American Society for Engineering Education Annual Conference & Exposition Copyright ©2002, American Society for Engineering Education

Porter, J., & Burnett, D., & Warren, M., & Fink, R. (2002, June), Teaching The Importance Of Data Correlation In Engineering Technology Paper presented at 2002 Annual Conference, Montreal, Canada. https://peer.asee.org/10763

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