Qazi, S., & Decker, R. C. (2012, June), Visualization of Nanoscale Components Using Atomic Force Microscopy   Paper presented at 2012 ASEE Annual Conference & Exposition, San Antonio, Texas. 10.18260/1-2--22222

\bibitem{asee_peer_22222}
  Qazi, S., \& Decker, R. C. (2012, June), \emph{Visualization of Nanoscale Components Using Atomic Force Microscopy }
  Paper presented at 2012 ASEE Annual Conference \& Exposition, San Antonio, Texas.
  10.18260/1-2--22222

Salahuddin Qazi and Robert C. Decker.  "Visualization of Nanoscale Components Using Atomic Force Microscopy ".  2012 ASEE Annual Conference & Exposition, San Antonio, Texas, 2012, June.  ASEE Conferences, 2012.  https://peer.asee.org/22222 Internet.  24 Apr, 2024

\bibitem{asee_peer_22222}
  Salahuddin Qazi and Robert C. Decker.
  "Visualization of Nanoscale Components Using Atomic Force Microscopy ".
  \emph{2012 ASEE Annual Conference \& Exposition, San Antonio, Texas, 2012, June}.
  ASEE Conferences, 2012.
  https://peer.asee.org/22222 Internet.  24 Apr, 2024

@INPROCEEDINGS{asee_peer_22222
author = "Salahuddin Qazi and Robert C. Decker"
title = "Visualization of Nanoscale Components Using Atomic Force Microscopy "
booktitle = "2012 ASEE Annual Conference \& Exposition"
year = "2012"
month = "June"
address = "San Antonio, Texas"
publisher = "ASEE Conferences"
note = {https://peer.asee.org/22222}
number = {10.18260/1-2--22222}
}

TY  - CPAPER
AB  -       Visualization of Nanonscale Components Using Atomic                            Force MicroscopyABSTRACT       Visualization of nanoscale components is an important technique that can enhance theundergraduate students’ understanding of the properties of matter at the nanometer level andhow they change at the interface between the domains of macroscopic and nanoscale world.Commonly used optical microscopy using light for visualization lacks the necessaryresolution at the nanoscale because of diffraction effects and the need for shorterwavelengths of light. The scanning electron microscopy achieves higher resolution throughelectron beam scattering, but requires a high vacuum environment and cannot be used fornonconductive biological samples. The Atomic Force Microscope (AFM), a scanning probeinstrument, uses a sharpened probe scanning over the sample while maintaining a very closespacing to the surface. It is a high-resolution microscopy tool with resolution of more than1000 times the optical diffraction limit. The use of atomic force microscopy for visualizationof nanoscale components is currently applied to various types of materials such as metal,semiconductors, soft biological samples, conductive and nonconductive materials inenvironments of air, liquid, and vacuum. The AFM is capable of measuring nanometer scaleimages of surfaces with little or no sample preparation as well as measuring threedimensional images of surfaces and studying the topography. Atomic force microscopy is anondestructive technique and can also be used as a manipulation tool to move and arrangenano-particles and to build nanostructures.    The purpose of our paper is to discuss the results of the use of atomic force microscopyfor visualization and manipulation of nanoscale components in various courses at the twoyear Community College and four year College. The paper will also discuss the results ofnanoscale imaging of various samples obtained while using AFM for different courses. Bothof these institutions have collaborated in an NSF CCLI/TUES award.                     ________________________________
AU  - Salahuddin Qazi
AU  - Robert C. Decker
CY  - San Antonio, Texas
DA  - 2012/06/10
PB  - ASEE Conferences
TI  - Visualization of Nanoscale Components Using Atomic Force Microscopy 
UR  - https://peer.asee.org/22222
DO  - 10.18260/1-2--22222
ER  -