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Session 3642

A Mathematical Model for White-Collar and Student Cognitive Turnover

Erick C. Jones, Ph.D., and Stephanie G. Adams, Ph.D. University of Nebraska-Lincoln

Abstract This paper and subsequent presentation present a framework for measuring Cognitive Turnover. Cognitive turnover (CT) is a combination of the turnover thought process and the results of burnout. In essence it occurs when key employees show up for work and seem to go through the motions. In the educational arena it occurs when students show up for classes and go through the motions. This phenomenon is becoming an important issue for organizations. As a result of Cognitive Turnover organizations experience increased costs associated with health insurance, disability claims, lost productivity and retention. The mathematical model presented here will be beneficial for organizations in identifying these workers or students prior to the onset of behavior which impacts the bottom line.

Introduction In the business community it has become critical that companies know how productive their knowledge workers are. One productivity issue is employees who show up for work and seem to go through the motions, but have mentally “quit” their jobs, often as a precursor to physically leaving. Similarly, in the education arena cognitive turnover is evident prior to students changing majors. In many cases students suffering CT become discouraged, lose interest in the subject, experience a drop in their grade and either change their major or leave the institution. This drawn out quitting process is termed “Cognitive Turnover (CT)” This research focuses on measuring knowledge workers and how they deal with challenges that may cause them to mentally depart from their jobs before they physically leave. “Proceedings of the 2004 American Society for Engineering Education Annual Conference & Exposition Copyright © 2004, American Society for Engineering Education"

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Adams, S., & Jones, E. (2004, June), A Mathematical Model For White Collar Cognitive Turnover Paper presented at 2004 Annual Conference, Salt Lake City, Utah. 10.18260/1-2--13479