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Adc Automated Testing Using Labview Software

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Conference

2004 Annual Conference

Location

Salt Lake City, Utah

Publication Date

June 20, 2004

Start Date

June 20, 2004

End Date

June 23, 2004

ISSN

2153-5965

Conference Session

Instrumentation and Laboratory Systems

Page Count

9

Page Numbers

9.147.1 - 9.147.9

Permanent URL

https://peer.asee.org/12920

Download Count

1047

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Paper Authors

author page

Cajetan Akujuobi

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Abstract
NOTE: The first page of text has been automatically extracted and included below in lieu of an abstract

Session Number 1320

ADC Automated Testing Using LabView Software

Ben E. Franklin, Cajetan M. Akujuobi, Warsame Ali

Center of Excellence for Communication Systems Technology Research (CECSTR) Dept. of Electrical Engineering Prairie View A&M University, Texas 77446

Abstract

The focus of this project is to implement automated test algorithms for testing analog-to- digital converters using LabView software. With the increase in bandwidth hungry applications the need for high speed and high resolution ADCs are needed on the front ends of the new systems that are being implemented today. As the designs become more complex, the ability to test these fast and high resolution ADCs becomes even more important. LabView allows the test engineer to interact with the device under test (DUT) through means of data acquisition and instrument control. Developing custom tests in LabView can result in reduced test time, which in turn will help reduce costs in testing. A linearity test will be presented for testing ADC static parameters in LabView, which include Differential Non-Linearity (DNL) and Integral Non-Linearity (INL).

1. Introduction

There are various methods of finding the code edges of an ADC such as binary search methods that are good for production testing of circuits that are essentially one-bit ADCs like comparators [1]. The use of binary search for ADCs with more resolution will result in at least 100 samples per iteration needed per code edge measurement, thus this will not benefit in the test time realm of production testing. The servo method is another method that utilizes a servo circuit that does the function of a step search, but is a fast hardware version. This method is good for production testing but it is not as fast as the histogram tests like the linear ramp and sinusoidal methods [1]. In ADC testing, a histogram shows how many times each output code appears in the response vector, regardless of the location [2], [3]. Linear ramp simplifies computation due to the proportionality of the step width to the number of hits of each code [2], [4]. The speed of the ramp cannot be too fast or the code will not be hit as many times as needed in order to get the most resolution and repeatability. The sinusoidal histogram method is the method of choice for this paper due to he relative ease of producing a pure sinusoidal waveform than a perfectly linear ramp for improved characterization of dynamic performance of the ADC

“Proceedings of the 2004 American Society for Engineering Education Annual Conference & Exposition Copyright 2004, American Society for Engineering Education”

Akujuobi, C. (2004, June), Adc Automated Testing Using Labview Software Paper presented at 2004 Annual Conference, Salt Lake City, Utah. https://peer.asee.org/12920

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