Rajeev K. Agrawal, North Carolina A&T State University; Zachary Kurmas, Grand Valley State University; Venkat N. Gudivada, Marshall University; Naser El-Bathy P.E., North Carolina A&T State University; Cameron Seay, North Carolina A&T State University
Hatem M. Wasfy, Advanced Science and Automation Corp.; Tamer M. Wasfy, Indiana University-Purdue University, Indianapolis; Jeanne Peters, Advanced Science and Automation Corp.; Riham M. Mahfouz, Thomas Nelson Community College
Dirk Schaefer, Georgia Institute of Technology; J. Lane Thames, Georgia Institute of Technology; Robert Donald Wellman Jr., Georgia Institute of Technology; Dazhong Wu, Georgia Institute of Technology; Sungshik Yim, Georgia Institute of Technology; David W. Rosen, Georgia Institute of Technology
Autar Kaw, University of South Florida; Ali Yalcin, University of South Florida; Gwen Lee-Thomas, Old Dominion University and Quality Measures, LLC; Duc T. Nguyen, Old Dominion University; Melinda R. Hess; James A. Eison, University of South Florida; Ram Pendyala, Arizona State University; Glen H. Besterfield, University of South Florida; Corina M. Owens, Battelle Memorial Institute
Robert P. Brazile, University of North Texas; Kathleen Swigger, University of North Texas; Matt Ray Hoyt, University of North Texas; Brian Lee, University of North Texas; Brandon Nelson, University of North Texas
Oscar Antonio Perez, University of Texas, El Paso; Virgilio Gonzalez, University of Texas, El Paso; Mike Thomas Pitcher, University of Texas, El Paso; Peter Golding, University of Texas, El Paso; Hugo Gomez, University of Texas, El Paso ; Pedro Arturo Espinoza, University of Texas, El Paso
Hatem M. Wasfy, Advanced Science and Automation Corp.; Tamer M. Wasfy, Indiana University-Purdue University, Indianapolis; Jeanne Peters, Advanced Science and Automation Corp.; Hazim A. El-Mounayri, Indiana University-Purdue University, Indianapolis