Peter M. Ostafichuk, University of British Columbia; Jim Sibley, University of British Columbia, Vancouver; H.F. Machiel Van der Loos, University of British Columbia
International Research Experience, Quality Improvement, and Programs/Curriculum Around the Globe
Collection
2012 ASEE Annual Conference & Exposition
Authors
Quamrul H. Mazumder, University of Michigan, Flint; Md. Rezaul Karim Ph.D., Khulna University, Bangladesh; Serajul I. Bhuiyan, Auburn University, Montgomery
International Research Experience, Quality Improvement, and Programs/Curriculum Around the Globe
Collection
2012 ASEE Annual Conference & Exposition
Authors
Lorraine N. Fleming, Howard University; Jennifer O. Burrell, Howard University; Wayne Patterson, Howard University; Afiya C. Fredericks, Howard University; Mohamed F. Chouikha, Howard University
International Research Experience, Quality Improvement, and Programs/Curriculum Around the Globe
Collection
2012 ASEE Annual Conference & Exposition
Authors
Brian E. Reed, University of Maryland, Baltimore County; Julia M. Ross, University of Maryland, Baltimore County; Brian Bowe, Dublin Institute of Technology; Gavin Duffy, Dublin Institute of Technology; Martin Gerard Rogers, Dublin Institute of Technology
Wayne Weaver, Michigan Technological University; Jeremy John Worm P.E., Michigan Technological University; Jeffrey D. Naber, Michigan Technological University; Leonard J. Bohmann, Michigan Technological University; John E. Beard, Michigan Technological University; Carl L. Anderson, Michigan Technological University; Bo Chen, Michigan Technological University; Jason M. Keith, Mississippi State University
Susan Darling Urban, Texas Tech University; Joseph E Urban, Texas Tech University; Susan A. Mengel, Texas Tech University; William M. Marcy P.E., Texas Tech University; Patrick E. Patterson, Texas Tech University
Andy Shaojin Zhang, New York City College of Technology; Farrukh Zia, New York City College of Technology; Iem H. Heng, New York City College of Technology; Sidi Berri, New York City College of Technology
Mark Ardis, Stevens Institute of Technology; David Budgen, Durham University, UK; Gregory W. Hislop, Drexel University; Renée McCauley, College of Charleston; Mark J. Sebern, Milwaukee School of Engineering