Asee peer logo
Well-matched quotation marks can be used to demarcate phrases, and the + and - operators can be used to require or exclude words respectively
Displaying all 4 results
Conference Session
Curriculum Development in Manufacturing Engineering Technology
Collection
2003 Annual Conference
Authors
Mohammad Davoud
Conference Session
Curriculum Development in Manufacturing Engineering Technology
Collection
2003 Annual Conference
Authors
Andrew Otieno; Clifford Mirman
Conference Session
Curriculum Development in Manufacturing Engineering Technology
Collection
2003 Annual Conference
Authors
David Hata
Conference Session
Curriculum Development in Manufacturing Engineering Technology
Collection
2003 Annual Conference
Authors
Fred Vondra; Ali Sekmen; Ismail Fidan