Harold T. Evensen, University of Wisconsin, Platteville; Molly M. Gribb P.E., University of Wisconsin, Platteville; Adel Nasiri, University of Wisconsin, Milwaukee
Edward F. Crawley, Massachusetts Institute of Technology; Anette Hosoi, Massachusetts Institute of Technology; Gregory L. Long Ph.D., Massachusetts Institute of Technology; Timothy Kassis, Massachusetts Institute of Technology; William Dickson, General Motors; Amitava 'Babi' Mitra, Massachusetts Institute of Technology
Ciprian Popoviciu, East Carolina University; Philip J. Lunsford II, East Carolina University; John Pickard, East Carolina University; Colby Lee Sawyer, East Carolina University; Dale Drummond, East Carolina University; Zachary Ryan Zynda, East Carolina University; Spencer Lee; Sean Wear
J. Sonnenberg-Klein, Georgia Institute of Technology; Edward J. Coyle, Georgia Institute of Technology; Randal T. Abler, Georgia Institute of Technology
J. Sonnenberg-Klein, Georgia Institute of Technology; Randal T. Abler, Georgia Institute of Technology; Edward J. Coyle, Georgia Institute of Technology
Mahdi Norouzi, Grand Valley State University; Janice S. Pawloski, Grand Valley State University; Huihui Qi, Grand Valley State University; Farid Jafari, Grand Valley State University
Gang Zheng, University of Michigan-Shanghai Jiao Tong University Joint Institute; Horst Hohberger, University of Michigan - Shanghai Jiao Tong University Joint Institute; Chengbin Ma, University of Michigan–Shanghai Jiao Tong University Joint Institute; Pradeep Ray, University of Michigan Joint Institute, Shanghai Jiao Tong University
Huihui H Wang, Jacksonville University; Lee Ann Jerome Clements, Jacksonville University; Cindy Leong; Misha M. Chalkley; Crandall Maines, Jacksonville University
Jacob Murray, Washington State University, Everett; Lucrezia Cuen Paxson, Washington State University, Everett; Soobin Seo, Washington State University, Everett; Mark Beattie, Washington State University, Everett
Wayne Weaver, Michigan Technological University; Jeremy John Worm P.E., Michigan Technological University; Jeffrey D. Naber, Michigan Technological University; Leonard J. Bohmann, Michigan Technological University; John E. Beard, Michigan Technological University; Carl L. Anderson, Michigan Technological University; Bo Chen, Michigan Technological University; Jason M. Keith, Mississippi State University
Andy Shaojin Zhang, New York City College of Technology; Farrukh Zia, New York City College of Technology; Iem H. Heng, New York City College of Technology; Sidi Berri, New York City College of Technology
Ellen M. Swartz, North Dakota State University; Ryan Striker P.E., North Dakota State University; Lauren Singelmann, North Dakota State University; Enrique Alvarez Vazquez, North Dakota State University; Mary Pearson, North Dakota State University; Stanley Shie Ng, Biola University
Amy Dunford, NYU Tandon School of Engineering; Edwing A. Medina, New York University Tandon School of Engineering; Jack Bringardner, New York University Tandon School of Engineering
David Clippinger, Pennsylvania State University, Behrend College ; Steven Nozaki, Pennsylvania State University, Behrend College; Ruth Camille Pflueger, Pennsylvania State University, Behrend College
Ryan Striker P.E., North Dakota State University; Mary Pearson, North Dakota State University; Ellen M. Swartz, North Dakota State University; Enrique Alvarez Vazquez, North Dakota State University; Lauren Singelmann, North Dakota State University; Stanley Shie Ng, Biola University