Akram Hossain, Purdue University, Calumet (Tech); Mohammad A. Zahraee, Purdue University, Calumet; Hamza Kadir, Purdue University Calumet (College of Technology)
Yacob Astatke, Morgan State University; Craig J. Scott, Morgan State University; Kenneth A. Connor, Rensselaer Polytechnic Institute; Jumoke O. Ladeji-Osias, Morgan State University
Luanna B. Prevost, Michigan State University; Kevin C. Haudek, Michigan State University; John E. Merrill, Michigan State University; Mark Urban-Lurain, Michigan State University
Baba Abdul, Washington State University; David B. Thiessen, Washington State University; Bernard J. Van Wie, Washington State University; Gary Robert Brown, Portland State University; Olusola O. Adesope, Washington State University, Pullman
Peter M. Ostafichuk, University of British Columbia; Jim Sibley, University of British Columbia, Vancouver; H.F. Machiel Van der Loos, University of British Columbia
International Research Experience, Quality Improvement, and Programs/Curriculum Around the Globe
Collection
2012 ASEE Annual Conference & Exposition
Authors
Quamrul H. Mazumder, University of Michigan, Flint; Md. Rezaul Karim Ph.D., Khulna University, Bangladesh; Serajul I. Bhuiyan, Auburn University, Montgomery
International Research Experience, Quality Improvement, and Programs/Curriculum Around the Globe
Collection
2012 ASEE Annual Conference & Exposition
Authors
Lorraine N. Fleming, Howard University; Jennifer O. Burrell, Howard University; Wayne Patterson, Howard University; Afiya C. Fredericks, Howard University; Mohamed F. Chouikha, Howard University
International Research Experience, Quality Improvement, and Programs/Curriculum Around the Globe
Collection
2012 ASEE Annual Conference & Exposition
Authors
Brian E. Reed, University of Maryland, Baltimore County; Julia M. Ross, University of Maryland, Baltimore County; Brian Bowe, Dublin Institute of Technology; Gavin Duffy, Dublin Institute of Technology; Martin Gerard Rogers, Dublin Institute of Technology
Wayne Weaver, Michigan Technological University; Jeremy John Worm P.E., Michigan Technological University; Jeffrey D. Naber, Michigan Technological University; Leonard J. Bohmann, Michigan Technological University; John E. Beard, Michigan Technological University; Carl L. Anderson, Michigan Technological University; Bo Chen, Michigan Technological University; Jason M. Keith, Mississippi State University