Mariana Silva, University of Illinois at Urbana - Champaign; Matthew West, University of Illinois at Urbana - Champaign; Sascha Hilgenfeldt, University of Illinois at Urbana - Champaign; Philipp Hieronymi; Nicolas Nytko, University of Illinois at Urbana - Champaign; Akshit Deshpande, University of Illinois at Urbana - Champaign; Jer-Chin Chuang, University of Illinois at Urbana - Champaign
John Sanders, California State University, Fullerton; Serop Kelkelian, California State University, Fullerton; Markus Wieser; Guenter Bischof, Joanneum
Yuqiu You, Morehead State University; Xiaolong Li, Morehead State University; Gabriel Alungbe, Morehead State University; Sam Mason, Morehead State University
Ann Goebel, Minnesota State University, Mankato; Harry Petersen, Minnesota State University, Mankato; William Peterson, Minnesota State University, Mankato
Hung-da Wan, University of Texas, San Antonio; Venkata Tarun Cherukuri, University of Texas, San Antonio; Saumya Tamma, University of Texas, San Antonio; Kranthi Kumar Tiyyagura, University of Texas, San Antonio
Min Jou, National Taiwan Normal University; Yu-Shiang Wu, China Institute of Technology; Han-Wei Zhang, National Taiwan University; Ming-Jenn Wu, National Taiwan Normal University
Jinru Liu, School of ECEE, SenSIP Center, Arizona State University; Jayaraman J. Thiagarajan, Arizona State University; Andreas S. Spanias, Arizona State University, School of ECEE, SenSIP Center; Karthikeyan Natesan Ramamurthy, Arizona State University; Shuang Hu, Arizona State University; Mahesh K. Banavar, Arizona State University
Dale S.L. Dolan, California Polytechnic State University; Vladimir I. Prodanov, California Polytechnic State University, San Luis Obispo; Taufik Taufik, California Polytechnic State University
David Jakob Fritz, Oklahoma State University; Wira Mulia, Oklahoma State University; Sohum Sohoni, Oklahoma State University; Kerri S. Kearney, Oklahoma State University; Mwarumba Mwavita, Oklahoma State University
Kenneth A. Connor, Rensselaer Polytechnic Institute; Frederick C Berry, Milwaukee School of Engineering; Mohamed F. Chouikha, Howard University; Dianna Newman, University at Albany/SUNY; Meghan Morris Deyoe, The Evaluation Consortium; Gavin Anaya; William Brubaker, Rensselaer Polytechnic Institute