Rachael Schmedlen, University of Michigan; Jin Woo Lee, University of Michigan; Prateek Shekhar, University of Michigan; Jan Stegemann, University of Michigan
Matthew Garett Young, Arkansas Tech University; Edward Carl Greco Jr., Arkansas Tech University; Scott Marks Jordan, Arkansas Tech University; Thomas Galen Limperis, Arkansas Tech University
Elise Anne Basque, Ecole Polytechnique de Montreal; Christine Brodeur, Ecole Polytechnique de Montréal; Manon Du Ruisseau, Ecole Polytechnique de Montreal; Jimmy Roberge, Ecole Polytechnique de Montreal; Arina Soare, Ecole Polytechnique de Montreal; Marie Tremblay , Ecole Polytechnique de Montreal
Matthew Cooper, North Carolina State University; Lisa G. Bullard, North Carolina State University; Christopher C. Willis, North Carolina State University - DELTA; Dan Spencer, North Carolina State University
Justin L Hess, Indiana University Purdue University, Indianapolis; Grant A Fore, Indiana University Purdue University, Indianapolis; Brandon H Sorge, Indiana University Purdue University, Indianapolis; M A Coleman, Indiana U Purdue U Indianapolis; Mary F. Price; Thomas William Hahn, IUPUI
Margot A Vigeant, Bucknell University; Jennifer Cole, Northwestern University; Kevin D. Dahm, Rowan University; Laura P. Ford, University of Tulsa; Lucas James Landherr, Northeastern University; David L. Silverstein P.E., University of Kentucky; Christy Wheeler West, University of South Alabama
Cheryl Q. Li, University of New Haven; Ronald S. Harichandran, University of New Haven; Maria-Isabel Carnasciali, University of New Haven; Nadiye O. Erdil, University of New Haven; Jean Nocito-Gobel, University of New Haven
Systems Engineering Learning Outcomes and Assessment
Collection
2016 ASEE Annual Conference & Exposition
Authors
Peizhu Zhang, Stevens Institute of Technology; Douglas A. Bodner, Georgia Institute of Technology; Richard Glenn Turner, Stevens Institute of Technology; Ross David Arnold, Stevens Institute of Technology; Jon Patrick Wade, Stevens Institute of Technology (School of Systems & Enterprises)
Natalie Jorion, University of Illinois, Chicago; Brian Douglas Gane, University of Illinois at Chicago; Louis V DiBello; James W Pellegrino, University of Illinois, Chicago