Lawrence E. Whitman, University of Arkansas at Little Rock; Kristin Dutcher Mann, University of Arkansas at Little Rock; Amar Shireesh Kanekar, University of Arkansas at Little Rock; Albert L Baker, University of Arkansas at Little Rock; Srikanth B Pidugu P.E., University of Arkansas at Little Rock
Abdulrahman Alsharif, Virginia Polytechnic Institute and State University; Lisa D. McNair, Virginia Polytechnic Institute and State University; Mark Vincent Huerta, Virginia Polytechnic Institute and State University; David Gray, Virginia Polytechnic Institute and State University; Yi Cao, Virginia Polytechnic Institute and State University
Stephen Andrew Wilkerson P.E., York College of Pennsylvania; Yargo Teixeira Gomes de Melo, York College of Pennsylvania; Alex Suarez, York College of Pennsylvania
Rania Al-Hammoud, University of Waterloo; Ona Egbue, University of South Carolina Upstate; Siwakorn Wisawakornwisit, University of Waterloo; Tesse Klompstra; Aotian Guan, University of Waterloo
Seyedehsareh Hashemikamangar, The University of Memphis; Stephanie S Ivey, The University of Memphis; Craig O. Stewart, The University of Memphis; Aaron Robinson, The University of Memphis
Yu Zhang, Zhejiang University; Xiaoning Zhang, Zhejiang University; Tuoyu Li, Institute of China’s Science, Technology and Education Policy, Zhejiang University; Min Ye, Zhejiang University
Abdulrahman Alsharif, Virginia Polytechnic Institute and State University; Mark Vincent Huerta, Virginia Polytechnic Institute and State University; David Gray, Virginia Polytechnic Institute and State University; Lisa D. McNair, Virginia Polytechnic Institute and State University
Tijesunimi Abraham Adeyemi, Morgan State University; Pelumi Olaitan Abiodun, Morgan State University; Oludare Adegbola Owolabi P.E., Morgan State University
David Clippinger, Pennsylvania State University, Behrend ; Ruth Camille Pflueger, Pennsylvania State University, Behrend College; Steven Nozaki, Pennsylvania State University, Behrend ; Johanna Fouts Bodenhamer
Margaret Webb, Virginia Tech Department of Engineering Education; Xiaoqi Feng, Aalto University, Espoo, Finland; Hanna Aarnio, School of Engineering, Aalto University, Espoo, Finland; Julia Sundman, School of Engineering, Aalto University, Espoo, Finland; Felicity Bilow, Virginia Polytechnic Institute and State University; Maija Taka, Aalto University; Marie C. Paretti, Virginia Polytechnic Institute and State University; Marko Keskinen, Aalto-yliopisto/Elektroniikan, tietoliikenteen