John M Robertson, Arizona State University, Polytechnic campus; Kathleen Meehan, Virginia Tech; Robert John Bowman, Rochester Institute of Technology (COE); Kenneth A Connor, Rensselaer Polytechnic Institute; Douglas A Mercer, Analog Devices Inc.
Karl L Wang, Department of Engineering Harvey Mudd College 301 Platt Boulevard Clarement, CA 91711 909-607-9136 ; Clint S Cole, Digilent, Inc.; Tinghui Wang, Digilent Inc; Joe Harris, Digilent, Inc.
Robert Joseph Michael PE, Gannon University; Fredrick A. Nitterright, Pennsylvania State University, Erie; Robert Edwards, Pennsylvania State University, Erie
Mohamed Tawfik, Spanish University for Distance Education (UNED); Elio Sancristobal, Spanish University for Distance Education (UNED); Sergio Martin, Spanish University for Distance Education (UNED); Rosario Gil, Spanish University for Distance Education (UNED); Alberto Pesquera Martín, Spanish University for Distance Education (UNED); Tovar Edmundo, Universidad Politécnica de Madrid; Martin Llamas-Nistal, University of Vigo; Gabriel Diaz Orueta, Spanish University for Distance Education (UNED); Juan Peire; Manuel Castro, Spanish University for Distance Education (UNED)
Noel Schulz, Mississippi State University; Herbert Ginn, Mississippi State University; Stanislaw Grzybowski, Mississippi State University; Anurag Srivastava, Mississippi State University; Jimena Bastos, Mississippi State University
Sridhar Condoor, Saint Louis University, Parks College of Eng.; Lawrence Boyer, Saint Louis University; Sanjay Jayaram, Saint Louis University, Parks College of Eng.