Seunghyun Chun, University of Texas, Austin, Department of Electrical and Computer Engineering; Bruce McCann, University of Texas, Austin; Ariane L. Beck, University of Texas, Austin; Eric Dean, National Instruments; Alexis Kwasinski, University of Texas at Austin
Patrick W. Pace, University of Texas, Austin; Kristin L. Wood, University of Texas, Austin; John J. Wood, U.S. Air Force Academy; Daniel D. Jensen, U.S. Air Force Academy; Brian K Skibba, Air Force Research Laboratory
Jay J. Bhatt, Drexel University (Eng.); Kevin P Drees, Oklahoma State University; Tom C. Volkening, Michigan State University; Carol A. Brach, University of Notre Dame; Mary L. Strife, West Virginia University; Amy S. Van Epps, Purdue University, West Lafayette; Bruce Neville, Texas A&M University
Tamara J. Moore, University of Minnesota, Twin Cities; Micah S. Stohlmann, University of Minnesota; Jennifer A. Kersten, University of Minnesota; Kristina Maruyama Tank, University of Minnesota; Aran W. Glancy, University of Minnesota
Geoffrey L. Herman, University of Illinois, Urbana-Champaign; Mark H. Somerville, Franklin W. Olin College of Engineering; David E. Goldberg, University of Illinois, Urbana-Champaign; Kerri Ann Green, University of Illinois, Urbana-Champaign
Hugh Jack P.Eng., Grand Valley State University; Robert L. Mott, University of Dayton; Mark J. Stratton, Society of Manufacturing Engineers; Phil Waldrop, Georgia Southern University; Karen Wosczyna-Birch, CT College of Technology